Kelvin probe force microscopy for local characterisation of active nanoelectronic devices

Frequency modulated Kelvin probe force microscopy (FM-KFM) is the method of choice for high resolution measurements of local surface potentials, yet on coarse topographic structures most researchers revert to amplitude modulated lift-mode techniques for better stability. This approach inevitably tra...

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Detalles Bibliográficos
Autores principales: Wagner, Tino, Beyer, Hannes, Reissner, Patrick, Mensch, Philipp, Riel, Heike, Gotsmann, Bernd, Stemmer, Andreas
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Beilstein-Institut 2015
Materias:
Full Research Paper
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4685916/
https://www.ncbi.nlm.nih.gov/pubmed/26734511
http://dx.doi.org/10.3762/bjnano.6.225

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4685916/
https://www.ncbi.nlm.nih.gov/pubmed/26734511
http://dx.doi.org/10.3762/bjnano.6.225

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