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Advanced electron crystallography through model-based imaging
The increasing need for precise determination of the atomic arrangement of non-periodic structures in materials design and the control of nanostructures explains the growing interest in quantitative transmission electron microscopy. The aim is to extract precise and accurate numbers for unknown stru...
Autores principales: | , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
International Union of Crystallography
2016
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4704081/ https://www.ncbi.nlm.nih.gov/pubmed/26870383 http://dx.doi.org/10.1107/S2052252515019727 |
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author | Van Aert, Sandra De Backer, Annick Martinez, Gerardo T. den Dekker, Arnold J. Van Dyck, Dirk Bals, Sara Van Tendeloo, Gustaaf |
author_facet | Van Aert, Sandra De Backer, Annick Martinez, Gerardo T. den Dekker, Arnold J. Van Dyck, Dirk Bals, Sara Van Tendeloo, Gustaaf |
author_sort | Van Aert, Sandra |
collection | PubMed |
description | The increasing need for precise determination of the atomic arrangement of non-periodic structures in materials design and the control of nanostructures explains the growing interest in quantitative transmission electron microscopy. The aim is to extract precise and accurate numbers for unknown structure parameters including atomic positions, chemical concentrations and atomic numbers. For this purpose, statistical parameter estimation theory has been shown to provide reliable results. In this theory, observations are considered purely as data planes, from which structure parameters have to be determined using a parametric model describing the images. As such, the positions of atom columns can be measured with a precision of the order of a few picometres, even though the resolution of the electron microscope is still one or two orders of magnitude larger. Moreover, small differences in average atomic number, which cannot be distinguished visually, can be quantified using high-angle annular dark-field scanning transmission electron microscopy images. In addition, this theory allows one to measure compositional changes at interfaces, to count atoms with single-atom sensitivity, and to reconstruct atomic structures in three dimensions. This feature article brings the reader up to date, summarizing the underlying theory and highlighting some of the recent applications of quantitative model-based transmisson electron microscopy. |
format | Online Article Text |
id | pubmed-4704081 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2016 |
publisher | International Union of Crystallography |
record_format | MEDLINE/PubMed |
spelling | pubmed-47040812016-02-11 Advanced electron crystallography through model-based imaging Van Aert, Sandra De Backer, Annick Martinez, Gerardo T. den Dekker, Arnold J. Van Dyck, Dirk Bals, Sara Van Tendeloo, Gustaaf IUCrJ Feature Articles The increasing need for precise determination of the atomic arrangement of non-periodic structures in materials design and the control of nanostructures explains the growing interest in quantitative transmission electron microscopy. The aim is to extract precise and accurate numbers for unknown structure parameters including atomic positions, chemical concentrations and atomic numbers. For this purpose, statistical parameter estimation theory has been shown to provide reliable results. In this theory, observations are considered purely as data planes, from which structure parameters have to be determined using a parametric model describing the images. As such, the positions of atom columns can be measured with a precision of the order of a few picometres, even though the resolution of the electron microscope is still one or two orders of magnitude larger. Moreover, small differences in average atomic number, which cannot be distinguished visually, can be quantified using high-angle annular dark-field scanning transmission electron microscopy images. In addition, this theory allows one to measure compositional changes at interfaces, to count atoms with single-atom sensitivity, and to reconstruct atomic structures in three dimensions. This feature article brings the reader up to date, summarizing the underlying theory and highlighting some of the recent applications of quantitative model-based transmisson electron microscopy. International Union of Crystallography 2016-01-01 /pmc/articles/PMC4704081/ /pubmed/26870383 http://dx.doi.org/10.1107/S2052252515019727 Text en © Sandra Van Aert et al. 2016 http://creativecommons.org/licenses/by/2.0/uk/ This is an open-access article distributed under the terms of the Creative Commons Attribution Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited. |
spellingShingle | Feature Articles Van Aert, Sandra De Backer, Annick Martinez, Gerardo T. den Dekker, Arnold J. Van Dyck, Dirk Bals, Sara Van Tendeloo, Gustaaf Advanced electron crystallography through model-based imaging |
title | Advanced electron crystallography through model-based imaging |
title_full | Advanced electron crystallography through model-based imaging |
title_fullStr | Advanced electron crystallography through model-based imaging |
title_full_unstemmed | Advanced electron crystallography through model-based imaging |
title_short | Advanced electron crystallography through model-based imaging |
title_sort | advanced electron crystallography through model-based imaging |
topic | Feature Articles |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4704081/ https://www.ncbi.nlm.nih.gov/pubmed/26870383 http://dx.doi.org/10.1107/S2052252515019727 |
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