Measurement of transient atomic displacements in thin films with picosecond and femtometer resolution

We report measurements of the transient structural response of weakly photo-excited thin films of BiFeO(3), Pb(Zr,Ti)O(3), and Bi and time-scales for interfacial thermal transport. Utilizing picosecond x-ray diffraction at a 1.28 MHz repetition rate with time resolution extending down to 15 ps, tran...

Descripción completa

Detalles Bibliográficos
Autores principales: Kozina, M., Hu, T., Wittenberg, J. S., Szilagyi, E., Trigo, M., Miller, T. A., Uher, C., Damodaran, A., Martin, L., Mehta, A., Corbett, J., Safranek, J., Reis, D. A., Lindenberg, A. M.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Crystallographic Association 2014
Materias:
ARTICLES
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4711600/
https://www.ncbi.nlm.nih.gov/pubmed/26798776
http://dx.doi.org/10.1063/1.4875347

Ejemplares similares

Ejemplares similares