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Time Invariant Surface Roughness Evolution during Atmospheric Pressure Thin Film Depositions

The evolution of thin film morphology during atmospheric pressure deposition has been studied utilizing Monte Carlo methods. Time invariant root-mean-squared roughness and local roughness morphology were both observed when employing a novel simulation parameter, modeling the effect of the experiment...

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Detalles Bibliográficos
Autores principales: Merkh, Thomas, Spivey, Robert, Lu, Toh Ming
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2016
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4728611/
https://www.ncbi.nlm.nih.gov/pubmed/26814165
http://dx.doi.org/10.1038/srep19888

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