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Long-Term Stability of One-Inch Condenser Microphones Calibrated at the National Institute of Standards and Technology

The devices calibrated most frequently by the acoustical measurement services at the National Institute of Standards and Technology (NIST) over the 50-year period from 1963 to 2012 were one-inch condenser microphones of three specific standard types: LS1Pn, LS1Po, and WS1P. Due to its long history o...

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Autores principales: Wagner, Randall P., Guthrie, William F.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 2015
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4730669/
https://www.ncbi.nlm.nih.gov/pubmed/26958445
http://dx.doi.org/10.6028/jres.120.012
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author Wagner, Randall P.
Guthrie, William F.
author_facet Wagner, Randall P.
Guthrie, William F.
author_sort Wagner, Randall P.
collection PubMed
description The devices calibrated most frequently by the acoustical measurement services at the National Institute of Standards and Technology (NIST) over the 50-year period from 1963 to 2012 were one-inch condenser microphones of three specific standard types: LS1Pn, LS1Po, and WS1P. Due to its long history of providing calibrations of such microphones to customers, NIST is in a unique position to analyze data concerning the long-term stability of these devices. This long history has enabled NIST to acquire and aggregate a substantial amount of repeat calibration data for a large number of microphones that belong to various other standards and calibration laboratories. In addition to determining microphone sensitivities at the time of calibration, it is important to have confidence that the microphones do not typically undergo significant drift as compared to the calibration uncertainty during the periods between calibrations. For each of the three microphone types, an average drift rate and approximate 95 % confidence interval were computed by two different statistical methods, and the results from the two methods were found to differ insignificantly in each case. These results apply to typical microphones of these types that are used in a suitable environment and handled with care. The average drift rate for Type LS1Pn microphones was −0.004 dB/year to 0.003 dB/year. The average drift rate for Type LS1Po microphones was −0.016 dB/year to 0.008 dB/year. The average drift rate for Type WS1P microphones was −0.004 dB/year to 0.018 dB/year. For each of these microphone types, the average drift rate is not significantly different from zero. This result is consistent with the performance expected of condenser microphones designed for use as transfer standards. In addition, the values that bound the confidence intervals are well within the limits specified for long-term stability in international standards. Even though these results show very good long-term stability historically for these microphone types, it is expected that periodic calibrations will always be done to track the calibration history of individual microphones and check for anomalies indicative of shifts in sensitivity.
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spelling pubmed-47306692016-03-08 Long-Term Stability of One-Inch Condenser Microphones Calibrated at the National Institute of Standards and Technology Wagner, Randall P. Guthrie, William F. J Res Natl Inst Stand Technol Article The devices calibrated most frequently by the acoustical measurement services at the National Institute of Standards and Technology (NIST) over the 50-year period from 1963 to 2012 were one-inch condenser microphones of three specific standard types: LS1Pn, LS1Po, and WS1P. Due to its long history of providing calibrations of such microphones to customers, NIST is in a unique position to analyze data concerning the long-term stability of these devices. This long history has enabled NIST to acquire and aggregate a substantial amount of repeat calibration data for a large number of microphones that belong to various other standards and calibration laboratories. In addition to determining microphone sensitivities at the time of calibration, it is important to have confidence that the microphones do not typically undergo significant drift as compared to the calibration uncertainty during the periods between calibrations. For each of the three microphone types, an average drift rate and approximate 95 % confidence interval were computed by two different statistical methods, and the results from the two methods were found to differ insignificantly in each case. These results apply to typical microphones of these types that are used in a suitable environment and handled with care. The average drift rate for Type LS1Pn microphones was −0.004 dB/year to 0.003 dB/year. The average drift rate for Type LS1Po microphones was −0.016 dB/year to 0.008 dB/year. The average drift rate for Type WS1P microphones was −0.004 dB/year to 0.018 dB/year. For each of these microphone types, the average drift rate is not significantly different from zero. This result is consistent with the performance expected of condenser microphones designed for use as transfer standards. In addition, the values that bound the confidence intervals are well within the limits specified for long-term stability in international standards. Even though these results show very good long-term stability historically for these microphone types, it is expected that periodic calibrations will always be done to track the calibration history of individual microphones and check for anomalies indicative of shifts in sensitivity. [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 2015-08-17 /pmc/articles/PMC4730669/ /pubmed/26958445 http://dx.doi.org/10.6028/jres.120.012 Text en https://creativecommons.org/publicdomain/zero/1.0/ The Journal of Research of the National Institute of Standards and Technology is a publication of the U.S. Government. The papers are in the public domain and are not subject to copyright in the United States. Articles from J Res may contain photographs or illustrations copyrighted by other commercial organizations or individuals that may not be used without obtaining prior approval from the holder of the copyright.
spellingShingle Article
Wagner, Randall P.
Guthrie, William F.
Long-Term Stability of One-Inch Condenser Microphones Calibrated at the National Institute of Standards and Technology
title Long-Term Stability of One-Inch Condenser Microphones Calibrated at the National Institute of Standards and Technology
title_full Long-Term Stability of One-Inch Condenser Microphones Calibrated at the National Institute of Standards and Technology
title_fullStr Long-Term Stability of One-Inch Condenser Microphones Calibrated at the National Institute of Standards and Technology
title_full_unstemmed Long-Term Stability of One-Inch Condenser Microphones Calibrated at the National Institute of Standards and Technology
title_short Long-Term Stability of One-Inch Condenser Microphones Calibrated at the National Institute of Standards and Technology
title_sort long-term stability of one-inch condenser microphones calibrated at the national institute of standards and technology
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4730669/
https://www.ncbi.nlm.nih.gov/pubmed/26958445
http://dx.doi.org/10.6028/jres.120.012
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