A Simple and Fast Spline Filtering Algorithm for Surface Metrology

Spline filters and their corresponding robust filters are commonly used filters recommended in ISO (the International Organization for Standardization) standards for surface evaluation. Generally, these linear and non-linear spline filters, composed of symmetric, positive-definite matrices, are solv...

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Detalles Bibliográficos
Autores principales: Zhang, Hao, Ott, Daniel, Song, John, Tong, Mingsi, Chu, Wei
Formato: Online Artículo Texto
Lenguaje:English
Publicado: [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 2015
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4730687/
https://www.ncbi.nlm.nih.gov/pubmed/26958443
http://dx.doi.org/10.6028/jres.120.010
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author Zhang, Hao
Ott, Daniel
Song, John
Tong, Mingsi
Chu, Wei
author_facet Zhang, Hao
Ott, Daniel
Song, John
Tong, Mingsi
Chu, Wei
author_sort Zhang, Hao
collection PubMed
description Spline filters and their corresponding robust filters are commonly used filters recommended in ISO (the International Organization for Standardization) standards for surface evaluation. Generally, these linear and non-linear spline filters, composed of symmetric, positive-definite matrices, are solved in an iterative fashion based on a Cholesky decomposition. They have been demonstrated to be relatively efficient, but complicated and inconvenient to implement. A new spline-filter algorithm is proposed by means of the discrete cosine transform or the discrete Fourier transform. The algorithm is conceptually simple and very convenient to implement.
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spelling pubmed-47306872016-03-08 A Simple and Fast Spline Filtering Algorithm for Surface Metrology Zhang, Hao Ott, Daniel Song, John Tong, Mingsi Chu, Wei J Res Natl Inst Stand Technol Article Spline filters and their corresponding robust filters are commonly used filters recommended in ISO (the International Organization for Standardization) standards for surface evaluation. Generally, these linear and non-linear spline filters, composed of symmetric, positive-definite matrices, are solved in an iterative fashion based on a Cholesky decomposition. They have been demonstrated to be relatively efficient, but complicated and inconvenient to implement. A new spline-filter algorithm is proposed by means of the discrete cosine transform or the discrete Fourier transform. The algorithm is conceptually simple and very convenient to implement. [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 2015-07-15 /pmc/articles/PMC4730687/ /pubmed/26958443 http://dx.doi.org/10.6028/jres.120.010 Text en https://creativecommons.org/publicdomain/zero/1.0/ The Journal of Research of the National Institute of Standards and Technology is a publication of the U.S. Government. The papers are in the public domain and are not subject to copyright in the United States. Articles from J Res may contain photographs or illustrations copyrighted by other commercial organizations or individuals that may not be used without obtaining prior approval from the holder of the copyright.
spellingShingle Article
Zhang, Hao
Ott, Daniel
Song, John
Tong, Mingsi
Chu, Wei
A Simple and Fast Spline Filtering Algorithm for Surface Metrology
title A Simple and Fast Spline Filtering Algorithm for Surface Metrology
title_full A Simple and Fast Spline Filtering Algorithm for Surface Metrology
title_fullStr A Simple and Fast Spline Filtering Algorithm for Surface Metrology
title_full_unstemmed A Simple and Fast Spline Filtering Algorithm for Surface Metrology
title_short A Simple and Fast Spline Filtering Algorithm for Surface Metrology
title_sort simple and fast spline filtering algorithm for surface metrology
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4730687/
https://www.ncbi.nlm.nih.gov/pubmed/26958443
http://dx.doi.org/10.6028/jres.120.010
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