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Influences of an Aluminum Covering Layer on the Performance of Cross-Like Hall Devices
This work studies the effects of an aluminum covering on the performance of cross-like Hall devices. Four different Hall sensor structures of various sizes were designed and fabricated. The sensitivity and offset of the Hall sensors, two key points impacting their performance, were characterized usi...
Autores principales: | , , , , , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2016
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4732139/ https://www.ncbi.nlm.nih.gov/pubmed/26784199 http://dx.doi.org/10.3390/s16010106 |
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author | Lyu, Fei Liu, Xinfu Ding, Yinjie Toh, Eng-Huat Zhang, Zhenyan Pan, Yifan Wang, Zhen Li, Chengjie Li, Li Sha, Jin Pan, Hongbing |
author_facet | Lyu, Fei Liu, Xinfu Ding, Yinjie Toh, Eng-Huat Zhang, Zhenyan Pan, Yifan Wang, Zhen Li, Chengjie Li, Li Sha, Jin Pan, Hongbing |
author_sort | Lyu, Fei |
collection | PubMed |
description | This work studies the effects of an aluminum covering on the performance of cross-like Hall devices. Four different Hall sensor structures of various sizes were designed and fabricated. The sensitivity and offset of the Hall sensors, two key points impacting their performance, were characterized using a self-built measurement system. The work analyzes the influences of the aluminum covering on those two aspects of the performance. The aluminum layer covering mainly leads to an eddy-current effect in an unstable magnetic field and an additional depletion region above the active region. Those two points have influences on the sensitivity and the offset voltage, respectively. The analysis guides the designer whether to choose covering with an aluminum layer the active region of the Hall sensor as a method to reduce the flicker noise and to improve the stability of the Hall sensor. Because Hall devices, as a reference element, always suffer from a large dispersion, improving their stability is a crucial issue. |
format | Online Article Text |
id | pubmed-4732139 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2016 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-47321392016-02-12 Influences of an Aluminum Covering Layer on the Performance of Cross-Like Hall Devices Lyu, Fei Liu, Xinfu Ding, Yinjie Toh, Eng-Huat Zhang, Zhenyan Pan, Yifan Wang, Zhen Li, Chengjie Li, Li Sha, Jin Pan, Hongbing Sensors (Basel) Article This work studies the effects of an aluminum covering on the performance of cross-like Hall devices. Four different Hall sensor structures of various sizes were designed and fabricated. The sensitivity and offset of the Hall sensors, two key points impacting their performance, were characterized using a self-built measurement system. The work analyzes the influences of the aluminum covering on those two aspects of the performance. The aluminum layer covering mainly leads to an eddy-current effect in an unstable magnetic field and an additional depletion region above the active region. Those two points have influences on the sensitivity and the offset voltage, respectively. The analysis guides the designer whether to choose covering with an aluminum layer the active region of the Hall sensor as a method to reduce the flicker noise and to improve the stability of the Hall sensor. Because Hall devices, as a reference element, always suffer from a large dispersion, improving their stability is a crucial issue. MDPI 2016-01-15 /pmc/articles/PMC4732139/ /pubmed/26784199 http://dx.doi.org/10.3390/s16010106 Text en © 2016 by the authors; licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons by Attribution (CC-BY) license (http://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Article Lyu, Fei Liu, Xinfu Ding, Yinjie Toh, Eng-Huat Zhang, Zhenyan Pan, Yifan Wang, Zhen Li, Chengjie Li, Li Sha, Jin Pan, Hongbing Influences of an Aluminum Covering Layer on the Performance of Cross-Like Hall Devices |
title | Influences of an Aluminum Covering Layer on the Performance of Cross-Like Hall Devices |
title_full | Influences of an Aluminum Covering Layer on the Performance of Cross-Like Hall Devices |
title_fullStr | Influences of an Aluminum Covering Layer on the Performance of Cross-Like Hall Devices |
title_full_unstemmed | Influences of an Aluminum Covering Layer on the Performance of Cross-Like Hall Devices |
title_short | Influences of an Aluminum Covering Layer on the Performance of Cross-Like Hall Devices |
title_sort | influences of an aluminum covering layer on the performance of cross-like hall devices |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4732139/ https://www.ncbi.nlm.nih.gov/pubmed/26784199 http://dx.doi.org/10.3390/s16010106 |
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