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Challenges of microtome‐based serial block‐face scanning electron microscopy in neuroscience

Serial block‐face scanning electron microscopy (SBEM) is becoming increasingly popular for a wide range of applications in many disciplines from biology to material sciences. This review focuses on applications for circuit reconstruction in neuroscience, which is one of the major driving forces adva...

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Detalles Bibliográficos
Autores principales: WANNER, A. A., KIRSCHMANN, M. A., GENOUD, C.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: John Wiley and Sons Inc. 2015
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4745002/
https://www.ncbi.nlm.nih.gov/pubmed/25907464
http://dx.doi.org/10.1111/jmi.12244

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