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Integrated measures for rough sets based on general binary relations
Uncertainty measures are important for knowledge discovery and data mining. Rough set theory (RST) is an important tool for measuring and processing uncertain information. Although many RST-based methods for measuring system uncertainty have been investigated, the existing measures cannot adequately...
Autores principales: | , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Springer International Publishing
2016
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4746208/ https://www.ncbi.nlm.nih.gov/pubmed/26900539 http://dx.doi.org/10.1186/s40064-016-1670-2 |
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author | Teng, Shuhua Liao, Fan He, Mi Lu, Min Nian, Yongjian |
author_facet | Teng, Shuhua Liao, Fan He, Mi Lu, Min Nian, Yongjian |
author_sort | Teng, Shuhua |
collection | PubMed |
description | Uncertainty measures are important for knowledge discovery and data mining. Rough set theory (RST) is an important tool for measuring and processing uncertain information. Although many RST-based methods for measuring system uncertainty have been investigated, the existing measures cannot adequately characterise the imprecision of a rough set. Moreover, these methods are suitable only for complete information systems, and it is difficult to generalise methods for complete information systems to incomplete information systems. To overcome these shortcomings, we present new uncertainty measures, integrated accuracy and integrated roughness, that are based on general binary relations, and we study important properties of these measures. A theoretical analysis and examples show that the proposed integrated measures are more precise than existing uncertainty measures, they are suitable for both complete and incomplete information systems, and they are logically consistent. Therefore, integrated accuracy and integrated roughness overcome the limitations of existing measures. This research not only develops the theory of uncertainty, it also expands the application domain of uncertainty measures and provides a theoretical basis for knowledge acquisition in information systems based on general binary relations. |
format | Online Article Text |
id | pubmed-4746208 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2016 |
publisher | Springer International Publishing |
record_format | MEDLINE/PubMed |
spelling | pubmed-47462082016-02-19 Integrated measures for rough sets based on general binary relations Teng, Shuhua Liao, Fan He, Mi Lu, Min Nian, Yongjian Springerplus Research Uncertainty measures are important for knowledge discovery and data mining. Rough set theory (RST) is an important tool for measuring and processing uncertain information. Although many RST-based methods for measuring system uncertainty have been investigated, the existing measures cannot adequately characterise the imprecision of a rough set. Moreover, these methods are suitable only for complete information systems, and it is difficult to generalise methods for complete information systems to incomplete information systems. To overcome these shortcomings, we present new uncertainty measures, integrated accuracy and integrated roughness, that are based on general binary relations, and we study important properties of these measures. A theoretical analysis and examples show that the proposed integrated measures are more precise than existing uncertainty measures, they are suitable for both complete and incomplete information systems, and they are logically consistent. Therefore, integrated accuracy and integrated roughness overcome the limitations of existing measures. This research not only develops the theory of uncertainty, it also expands the application domain of uncertainty measures and provides a theoretical basis for knowledge acquisition in information systems based on general binary relations. Springer International Publishing 2016-02-09 /pmc/articles/PMC4746208/ /pubmed/26900539 http://dx.doi.org/10.1186/s40064-016-1670-2 Text en © Teng et al. 2016 Open AccessThis article is distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution, and reproduction in any medium, provided you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. |
spellingShingle | Research Teng, Shuhua Liao, Fan He, Mi Lu, Min Nian, Yongjian Integrated measures for rough sets based on general binary relations |
title | Integrated measures for rough sets based on general binary relations |
title_full | Integrated measures for rough sets based on general binary relations |
title_fullStr | Integrated measures for rough sets based on general binary relations |
title_full_unstemmed | Integrated measures for rough sets based on general binary relations |
title_short | Integrated measures for rough sets based on general binary relations |
title_sort | integrated measures for rough sets based on general binary relations |
topic | Research |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4746208/ https://www.ncbi.nlm.nih.gov/pubmed/26900539 http://dx.doi.org/10.1186/s40064-016-1670-2 |
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