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Integrated measures for rough sets based on general binary relations

Uncertainty measures are important for knowledge discovery and data mining. Rough set theory (RST) is an important tool for measuring and processing uncertain information. Although many RST-based methods for measuring system uncertainty have been investigated, the existing measures cannot adequately...

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Detalles Bibliográficos
Autores principales: Teng, Shuhua, Liao, Fan, He, Mi, Lu, Min, Nian, Yongjian
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer International Publishing 2016
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4746208/
https://www.ncbi.nlm.nih.gov/pubmed/26900539
http://dx.doi.org/10.1186/s40064-016-1670-2
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author Teng, Shuhua
Liao, Fan
He, Mi
Lu, Min
Nian, Yongjian
author_facet Teng, Shuhua
Liao, Fan
He, Mi
Lu, Min
Nian, Yongjian
author_sort Teng, Shuhua
collection PubMed
description Uncertainty measures are important for knowledge discovery and data mining. Rough set theory (RST) is an important tool for measuring and processing uncertain information. Although many RST-based methods for measuring system uncertainty have been investigated, the existing measures cannot adequately characterise the imprecision of a rough set. Moreover, these methods are suitable only for complete information systems, and it is difficult to generalise methods for complete information systems to incomplete information systems. To overcome these shortcomings, we present new uncertainty measures, integrated accuracy and integrated roughness, that are based on general binary relations, and we study important properties of these measures. A theoretical analysis and examples show that the proposed integrated measures are more precise than existing uncertainty measures, they are suitable for both complete and incomplete information systems, and they are logically consistent. Therefore, integrated accuracy and integrated roughness overcome the limitations of existing measures. This research not only develops the theory of uncertainty, it also expands the application domain of uncertainty measures and provides a theoretical basis for knowledge acquisition in information systems based on general binary relations.
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spelling pubmed-47462082016-02-19 Integrated measures for rough sets based on general binary relations Teng, Shuhua Liao, Fan He, Mi Lu, Min Nian, Yongjian Springerplus Research Uncertainty measures are important for knowledge discovery and data mining. Rough set theory (RST) is an important tool for measuring and processing uncertain information. Although many RST-based methods for measuring system uncertainty have been investigated, the existing measures cannot adequately characterise the imprecision of a rough set. Moreover, these methods are suitable only for complete information systems, and it is difficult to generalise methods for complete information systems to incomplete information systems. To overcome these shortcomings, we present new uncertainty measures, integrated accuracy and integrated roughness, that are based on general binary relations, and we study important properties of these measures. A theoretical analysis and examples show that the proposed integrated measures are more precise than existing uncertainty measures, they are suitable for both complete and incomplete information systems, and they are logically consistent. Therefore, integrated accuracy and integrated roughness overcome the limitations of existing measures. This research not only develops the theory of uncertainty, it also expands the application domain of uncertainty measures and provides a theoretical basis for knowledge acquisition in information systems based on general binary relations. Springer International Publishing 2016-02-09 /pmc/articles/PMC4746208/ /pubmed/26900539 http://dx.doi.org/10.1186/s40064-016-1670-2 Text en © Teng et al. 2016 Open AccessThis article is distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution, and reproduction in any medium, provided you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made.
spellingShingle Research
Teng, Shuhua
Liao, Fan
He, Mi
Lu, Min
Nian, Yongjian
Integrated measures for rough sets based on general binary relations
title Integrated measures for rough sets based on general binary relations
title_full Integrated measures for rough sets based on general binary relations
title_fullStr Integrated measures for rough sets based on general binary relations
title_full_unstemmed Integrated measures for rough sets based on general binary relations
title_short Integrated measures for rough sets based on general binary relations
title_sort integrated measures for rough sets based on general binary relations
topic Research
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4746208/
https://www.ncbi.nlm.nih.gov/pubmed/26900539
http://dx.doi.org/10.1186/s40064-016-1670-2
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