PCDTBT based solar cells: one year of operation under real-world conditions

We present measurements of the outdoor stability of PCDTBT:PC(71)BM based bulk heterojunction organic solar cells for over the course of a year. We find that the devices undergo a burn-in process lasting 450 hours followed by a T(S)80 lifetime of up to 6200 hours. We conclude that in the most stable...

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Detalles Bibliográficos
Autores principales: Zhang, Yiwei, Bovill, Edward, Kingsley, James, Buckley, Alastair R., Yi, Hunan, Iraqi, Ahmed, Wang, Tao, Lidzey, David G.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2016
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4746663/
https://www.ncbi.nlm.nih.gov/pubmed/26857950
http://dx.doi.org/10.1038/srep21632
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author Zhang, Yiwei
Bovill, Edward
Kingsley, James
Buckley, Alastair R.
Yi, Hunan
Iraqi, Ahmed
Wang, Tao
Lidzey, David G.
author_facet Zhang, Yiwei
Bovill, Edward
Kingsley, James
Buckley, Alastair R.
Yi, Hunan
Iraqi, Ahmed
Wang, Tao
Lidzey, David G.
author_sort Zhang, Yiwei
collection PubMed
description We present measurements of the outdoor stability of PCDTBT:PC(71)BM based bulk heterojunction organic solar cells for over the course of a year. We find that the devices undergo a burn-in process lasting 450 hours followed by a T(S)80 lifetime of up to 6200 hours. We conclude that in the most stable devices, the observed T(S)80 lifetime is limited by thermally-induced stress between the device layers, as well as materials degradation as a result of edge-ingress of water or moisture through the encapsulation.
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spelling pubmed-47466632016-02-17 PCDTBT based solar cells: one year of operation under real-world conditions Zhang, Yiwei Bovill, Edward Kingsley, James Buckley, Alastair R. Yi, Hunan Iraqi, Ahmed Wang, Tao Lidzey, David G. Sci Rep Article We present measurements of the outdoor stability of PCDTBT:PC(71)BM based bulk heterojunction organic solar cells for over the course of a year. We find that the devices undergo a burn-in process lasting 450 hours followed by a T(S)80 lifetime of up to 6200 hours. We conclude that in the most stable devices, the observed T(S)80 lifetime is limited by thermally-induced stress between the device layers, as well as materials degradation as a result of edge-ingress of water or moisture through the encapsulation. Nature Publishing Group 2016-02-09 /pmc/articles/PMC4746663/ /pubmed/26857950 http://dx.doi.org/10.1038/srep21632 Text en Copyright © 2016, Macmillan Publishers Limited http://creativecommons.org/licenses/by/4.0/ This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/
spellingShingle Article
Zhang, Yiwei
Bovill, Edward
Kingsley, James
Buckley, Alastair R.
Yi, Hunan
Iraqi, Ahmed
Wang, Tao
Lidzey, David G.
PCDTBT based solar cells: one year of operation under real-world conditions
title PCDTBT based solar cells: one year of operation under real-world conditions
title_full PCDTBT based solar cells: one year of operation under real-world conditions
title_fullStr PCDTBT based solar cells: one year of operation under real-world conditions
title_full_unstemmed PCDTBT based solar cells: one year of operation under real-world conditions
title_short PCDTBT based solar cells: one year of operation under real-world conditions
title_sort pcdtbt based solar cells: one year of operation under real-world conditions
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4746663/
https://www.ncbi.nlm.nih.gov/pubmed/26857950
http://dx.doi.org/10.1038/srep21632
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