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X-ray Reciprocal Space Mapping of Graded Al(x)Ga(1 − x)N Films and Nanowires
The depth distribution of strain and composition in graded Al(x)Ga(1 − x)N films and nanowires (NWs) are studied theoretically using the kinematical theory of X-ray diffraction. By calculating [Formula: see text] reciprocal space maps (RSMs), we demonstrate significant differences in the intensity d...
Autores principales: | Stanchu, Hryhorii V., Kuchuk, Andrian V., Kladko, Vasyl P., Ware, Morgan E., Mazur, Yuriy I., Zytkiewicz, Zbigniew R., Belyaev, Alexander E., Salamo, Gregory J. |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Springer US
2016
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4747973/ https://www.ncbi.nlm.nih.gov/pubmed/26860714 http://dx.doi.org/10.1186/s11671-016-1299-7 |
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