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The ion microscope as a tool for quantitative measurements in the extreme ultraviolet

We demonstrate a tool for quantitative measurements in the extreme ultraviolet (EUV) spectral region measuring spatially resolved atomic ionization products at the focus of an EUV beam. The ionizing radiation is a comb of the 11(th)–15(th) harmonics of a Ti:Sapphire femtosecond laser beam produced i...

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Detalles Bibliográficos
Autores principales: Tsatrafyllis, N., Bergues, B., Schröder, H., Veisz, L., Skantzakis, E., Gray, D., Bodi, B., Kuhn, S., Tsakiris, G. D., Charalambidis, D., Tzallas, P.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2016
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4751500/
https://www.ncbi.nlm.nih.gov/pubmed/26868370
http://dx.doi.org/10.1038/srep21556
Descripción
Sumario:We demonstrate a tool for quantitative measurements in the extreme ultraviolet (EUV) spectral region measuring spatially resolved atomic ionization products at the focus of an EUV beam. The ionizing radiation is a comb of the 11(th)–15(th) harmonics of a Ti:Sapphire femtosecond laser beam produced in a Xenon gas jet. The spatial ion distribution at the focus of the harmonics is recorded using an ion microscope. Spatially resolved single- and two-photon ionization products of Argon and Helium are observed. From such ion distributions single- and two-photon generalized cross sections can be extracted by a self-calibrating method. The observation of spatially resolved two-EUV-photon ionization constitutes an initial step towards future single-shot temporal characterization of attosecond pulses.