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Particle alignment reliability in single particle electron cryomicroscopy: a general approach

Electron Microscopy is reaching new capabilities thanks to the combined effect of new technologies and new image processing methods. However, the reconstruction process is still complex, requiring many steps and elaborated optimization procedures. Therefore, the possibility to reach a wrong structur...

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Detalles Bibliográficos
Autores principales: Vargas, J., Otón, J., Marabini, R., Carazo, J. M., Sorzano, C. O. S.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2016
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4761946/
https://www.ncbi.nlm.nih.gov/pubmed/26899789
http://dx.doi.org/10.1038/srep21626
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author Vargas, J.
Otón, J.
Marabini, R.
Carazo, J. M.
Sorzano, C. O. S.
author_facet Vargas, J.
Otón, J.
Marabini, R.
Carazo, J. M.
Sorzano, C. O. S.
author_sort Vargas, J.
collection PubMed
description Electron Microscopy is reaching new capabilities thanks to the combined effect of new technologies and new image processing methods. However, the reconstruction process is still complex, requiring many steps and elaborated optimization procedures. Therefore, the possibility to reach a wrong structure exists, justifying the need of robust statistical tests. In this work, we present a conceptually simple alignment test, which does not require tilt-pair images, to evaluate the alignment consistency between a set of projection images with respect to a given 3D density map. We test the approach on a number of problems in 3DEM, especially the ranking and evaluation of initial 3D volumes and high resolution 3D maps, where we show its usefulness in providing an objective evaluation for maps that have recently been subject to a strong controversy in the field. Additionally, this alignment statistical test can be linked to the early stages of structure solving of new complexes, streamlining the whole process.
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spelling pubmed-47619462016-02-29 Particle alignment reliability in single particle electron cryomicroscopy: a general approach Vargas, J. Otón, J. Marabini, R. Carazo, J. M. Sorzano, C. O. S. Sci Rep Article Electron Microscopy is reaching new capabilities thanks to the combined effect of new technologies and new image processing methods. However, the reconstruction process is still complex, requiring many steps and elaborated optimization procedures. Therefore, the possibility to reach a wrong structure exists, justifying the need of robust statistical tests. In this work, we present a conceptually simple alignment test, which does not require tilt-pair images, to evaluate the alignment consistency between a set of projection images with respect to a given 3D density map. We test the approach on a number of problems in 3DEM, especially the ranking and evaluation of initial 3D volumes and high resolution 3D maps, where we show its usefulness in providing an objective evaluation for maps that have recently been subject to a strong controversy in the field. Additionally, this alignment statistical test can be linked to the early stages of structure solving of new complexes, streamlining the whole process. Nature Publishing Group 2016-02-22 /pmc/articles/PMC4761946/ /pubmed/26899789 http://dx.doi.org/10.1038/srep21626 Text en Copyright © 2016, Macmillan Publishers Limited http://creativecommons.org/licenses/by/4.0/ This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/
spellingShingle Article
Vargas, J.
Otón, J.
Marabini, R.
Carazo, J. M.
Sorzano, C. O. S.
Particle alignment reliability in single particle electron cryomicroscopy: a general approach
title Particle alignment reliability in single particle electron cryomicroscopy: a general approach
title_full Particle alignment reliability in single particle electron cryomicroscopy: a general approach
title_fullStr Particle alignment reliability in single particle electron cryomicroscopy: a general approach
title_full_unstemmed Particle alignment reliability in single particle electron cryomicroscopy: a general approach
title_short Particle alignment reliability in single particle electron cryomicroscopy: a general approach
title_sort particle alignment reliability in single particle electron cryomicroscopy: a general approach
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4761946/
https://www.ncbi.nlm.nih.gov/pubmed/26899789
http://dx.doi.org/10.1038/srep21626
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