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Particle alignment reliability in single particle electron cryomicroscopy: a general approach

Electron Microscopy is reaching new capabilities thanks to the combined effect of new technologies and new image processing methods. However, the reconstruction process is still complex, requiring many steps and elaborated optimization procedures. Therefore, the possibility to reach a wrong structur...

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Detalles Bibliográficos
Autores principales:	Vargas, J., Otón, J., Marabini, R., Carazo, J. M., Sorzano, C. O. S.
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Nature Publishing Group 2016
Materias:	Article
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4761946/ https://www.ncbi.nlm.nih.gov/pubmed/26899789 http://dx.doi.org/10.1038/srep21626

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