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Oxidation Effects in Rare Earth Doped Topological Insulator Thin Films
The breaking of time-reversal symmetry (TRS) in topological insulators is a prerequisite for unlocking their exotic properties and for observing the quantum anomalous Hall effect (QAHE). The incorporation of dopants which exhibit magnetic long-range order is the most promising approach for TRS-break...
Autores principales: | , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group
2016
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4783712/ https://www.ncbi.nlm.nih.gov/pubmed/26956771 http://dx.doi.org/10.1038/srep22935 |
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author | Figueroa, A. I. van der Laan, G. Harrison, S. E. Cibin, G. Hesjedal, T. |
author_facet | Figueroa, A. I. van der Laan, G. Harrison, S. E. Cibin, G. Hesjedal, T. |
author_sort | Figueroa, A. I. |
collection | PubMed |
description | The breaking of time-reversal symmetry (TRS) in topological insulators is a prerequisite for unlocking their exotic properties and for observing the quantum anomalous Hall effect (QAHE). The incorporation of dopants which exhibit magnetic long-range order is the most promising approach for TRS-breaking. REBiTe(3), wherein 50% of the Bi is substitutionally replaced by a RE atom (RE = Gd, Dy, and Ho), is a predicted QAHE system. Despite the low solubility of REs in bulk crystals of a few %, highly doped thin films have been demonstrated, which are free of secondary phases and of high crystalline quality. Here we study the effects of exposure to atmosphere of rare earth-doped Bi(2)(Se, Te)(3) thin films using x-ray absorption spectroscopy. We demonstrate that these RE dopants are all trivalent and effectively substitute for Bi(3+) in the Bi(2)(Se, Te)(3) matrix. We find an unexpected high degree of sample oxidation for the most highly doped samples, which is not restricted to the surface of the films. In the low-doping limit, the RE-doped films mostly show surface oxidation, which can be prevented by surface passivation, encapsulation, or in-situ cleaving to recover the topological surface state. |
format | Online Article Text |
id | pubmed-4783712 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2016 |
publisher | Nature Publishing Group |
record_format | MEDLINE/PubMed |
spelling | pubmed-47837122016-03-11 Oxidation Effects in Rare Earth Doped Topological Insulator Thin Films Figueroa, A. I. van der Laan, G. Harrison, S. E. Cibin, G. Hesjedal, T. Sci Rep Article The breaking of time-reversal symmetry (TRS) in topological insulators is a prerequisite for unlocking their exotic properties and for observing the quantum anomalous Hall effect (QAHE). The incorporation of dopants which exhibit magnetic long-range order is the most promising approach for TRS-breaking. REBiTe(3), wherein 50% of the Bi is substitutionally replaced by a RE atom (RE = Gd, Dy, and Ho), is a predicted QAHE system. Despite the low solubility of REs in bulk crystals of a few %, highly doped thin films have been demonstrated, which are free of secondary phases and of high crystalline quality. Here we study the effects of exposure to atmosphere of rare earth-doped Bi(2)(Se, Te)(3) thin films using x-ray absorption spectroscopy. We demonstrate that these RE dopants are all trivalent and effectively substitute for Bi(3+) in the Bi(2)(Se, Te)(3) matrix. We find an unexpected high degree of sample oxidation for the most highly doped samples, which is not restricted to the surface of the films. In the low-doping limit, the RE-doped films mostly show surface oxidation, which can be prevented by surface passivation, encapsulation, or in-situ cleaving to recover the topological surface state. Nature Publishing Group 2016-03-09 /pmc/articles/PMC4783712/ /pubmed/26956771 http://dx.doi.org/10.1038/srep22935 Text en Copyright © 2016, Macmillan Publishers Limited http://creativecommons.org/licenses/by/4.0/ This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/ |
spellingShingle | Article Figueroa, A. I. van der Laan, G. Harrison, S. E. Cibin, G. Hesjedal, T. Oxidation Effects in Rare Earth Doped Topological Insulator Thin Films |
title | Oxidation Effects in Rare Earth Doped Topological Insulator Thin Films |
title_full | Oxidation Effects in Rare Earth Doped Topological Insulator Thin Films |
title_fullStr | Oxidation Effects in Rare Earth Doped Topological Insulator Thin Films |
title_full_unstemmed | Oxidation Effects in Rare Earth Doped Topological Insulator Thin Films |
title_short | Oxidation Effects in Rare Earth Doped Topological Insulator Thin Films |
title_sort | oxidation effects in rare earth doped topological insulator thin films |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4783712/ https://www.ncbi.nlm.nih.gov/pubmed/26956771 http://dx.doi.org/10.1038/srep22935 |
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