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Simultaneous X-ray diffraction and phase-contrast imaging for investigating material deformation mechanisms during high-rate loading
Using a high-speed camera and an intensified charge-coupled device (ICCD), a simultaneous X-ray imaging and diffraction technique has been developed for studying dynamic material behaviors during high-rate tensile loading. A Kolsky tension bar has been used to pull samples at 1000 s(−1) and 5000 s(−...
| Autores principales: | , , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
International Union of Crystallography
2015
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4785860/ https://www.ncbi.nlm.nih.gov/pubmed/25537588 http://dx.doi.org/10.1107/S1600577514022747 |