Effect of X-ray spot size on liquid jet photoelectron spectroscopy

A 30 µm pinhole is introduced in the intermediate focus of the SIM beamline at the Swiss Light Source to improve the spot size at the second downstream focus, which is used here for liquid jet X-ray photoelectron spectroscopy experiments. The 30 µm pinhole reduces the beam dimensions from 250 (v) ×...

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Detalles Bibliográficos
Autores principales: Olivieri, Giorgia, Goel, Alok, Kleibert, Armin, Brown, Matthew A.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2015
Materias:
Short Communications
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4787839/
https://www.ncbi.nlm.nih.gov/pubmed/26524318
http://dx.doi.org/10.1107/S1600577515016306
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author Olivieri, Giorgia
Goel, Alok
Kleibert, Armin
Brown, Matthew A.
author_facet Olivieri, Giorgia
Goel, Alok
Kleibert, Armin
Brown, Matthew A.
author_sort Olivieri, Giorgia
collection PubMed
description A 30 µm pinhole is introduced in the intermediate focus of the SIM beamline at the Swiss Light Source to improve the spot size at the second downstream focus, which is used here for liquid jet X-ray photoelectron spectroscopy experiments. The 30 µm pinhole reduces the beam dimensions from 250 (v) × 100 (h) µm to 75 × 45 µm for a vertical exit slit of 100 µm. The smaller X-ray spot results in a substantial decrease in the gas-phase contribution of the spectra from 40% down to 20% and will help to simplify the interpretation and peak assignments of future experiments.
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spelling pubmed-47878392016-03-22 Effect of X-ray spot size on liquid jet photoelectron spectroscopy Olivieri, Giorgia Goel, Alok Kleibert, Armin Brown, Matthew A. J Synchrotron Radiat Short Communications A 30 µm pinhole is introduced in the intermediate focus of the SIM beamline at the Swiss Light Source to improve the spot size at the second downstream focus, which is used here for liquid jet X-ray photoelectron spectroscopy experiments. The 30 µm pinhole reduces the beam dimensions from 250 (v) × 100 (h) µm to 75 × 45 µm for a vertical exit slit of 100 µm. The smaller X-ray spot results in a substantial decrease in the gas-phase contribution of the spectra from 40% down to 20% and will help to simplify the interpretation and peak assignments of future experiments. International Union of Crystallography 2015-09-30 /pmc/articles/PMC4787839/ /pubmed/26524318 http://dx.doi.org/10.1107/S1600577515016306 Text en © Giorgia Olivieri et al. 2015 http://creativecommons.org/licenses/by/2.0/uk/ This is an open-access article distributed under the terms of the Creative Commons Attribution Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited.
spellingShingle Short Communications
Olivieri, Giorgia
Goel, Alok
Kleibert, Armin
Brown, Matthew A.
Effect of X-ray spot size on liquid jet photoelectron spectroscopy
title Effect of X-ray spot size on liquid jet photoelectron spectroscopy
title_full Effect of X-ray spot size on liquid jet photoelectron spectroscopy
title_fullStr Effect of X-ray spot size on liquid jet photoelectron spectroscopy
title_full_unstemmed Effect of X-ray spot size on liquid jet photoelectron spectroscopy
title_short Effect of X-ray spot size on liquid jet photoelectron spectroscopy
title_sort effect of x-ray spot size on liquid jet photoelectron spectroscopy
topic Short Communications
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4787839/
https://www.ncbi.nlm.nih.gov/pubmed/26524318
http://dx.doi.org/10.1107/S1600577515016306
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