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Effect of X-ray spot size on liquid jet photoelectron spectroscopy
A 30 µm pinhole is introduced in the intermediate focus of the SIM beamline at the Swiss Light Source to improve the spot size at the second downstream focus, which is used here for liquid jet X-ray photoelectron spectroscopy experiments. The 30 µm pinhole reduces the beam dimensions from 250 (v) ×...
| Autores principales: | , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
International Union of Crystallography
2015
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4787839/ https://www.ncbi.nlm.nih.gov/pubmed/26524318 http://dx.doi.org/10.1107/S1600577515016306 |