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A Differential Monolithically Integrated Inductive Linear Displacement Measurement Microsystem
An inductive linear displacement measurement microsystem realized as a monolithic Application-Specific Integrated Circuit (ASIC) is presented. The system comprises integrated microtransformers as sensing elements, and analog front-end electronics for signal processing and demodulation, both jointly...
Autores principales: | , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2016
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4813959/ https://www.ncbi.nlm.nih.gov/pubmed/26999146 http://dx.doi.org/10.3390/s16030384 |
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author | Podhraški, Matija Trontelj, Janez |
author_facet | Podhraški, Matija Trontelj, Janez |
author_sort | Podhraški, Matija |
collection | PubMed |
description | An inductive linear displacement measurement microsystem realized as a monolithic Application-Specific Integrated Circuit (ASIC) is presented. The system comprises integrated microtransformers as sensing elements, and analog front-end electronics for signal processing and demodulation, both jointly fabricated in a conventional commercially available four-metal 350-nm CMOS process. The key novelty of the presented system is its full integration, straightforward fabrication, and ease of application, requiring no external light or magnetic field source. Such systems therefore have the possibility of substituting certain conventional position encoder types. The microtransformers are excited by an AC signal in MHz range. The displacement information is modulated into the AC signal by a metal grating scale placed over the microsystem, employing a differential measurement principle. Homodyne mixing is used for the demodulation of the scale displacement information, returned by the ASIC as a DC signal in two quadrature channels allowing the determination of linear position of the target scale. The microsystem design, simulations, and characterization are presented. Various system operating conditions such as frequency, phase, target scale material and distance have been experimentally evaluated. The best results have been achieved at 4 MHz, demonstrating a linear resolution of 20 µm with steel and copper scale, having respective sensitivities of 0.71 V/mm and 0.99 V/mm. |
format | Online Article Text |
id | pubmed-4813959 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2016 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-48139592016-04-06 A Differential Monolithically Integrated Inductive Linear Displacement Measurement Microsystem Podhraški, Matija Trontelj, Janez Sensors (Basel) Article An inductive linear displacement measurement microsystem realized as a monolithic Application-Specific Integrated Circuit (ASIC) is presented. The system comprises integrated microtransformers as sensing elements, and analog front-end electronics for signal processing and demodulation, both jointly fabricated in a conventional commercially available four-metal 350-nm CMOS process. The key novelty of the presented system is its full integration, straightforward fabrication, and ease of application, requiring no external light or magnetic field source. Such systems therefore have the possibility of substituting certain conventional position encoder types. The microtransformers are excited by an AC signal in MHz range. The displacement information is modulated into the AC signal by a metal grating scale placed over the microsystem, employing a differential measurement principle. Homodyne mixing is used for the demodulation of the scale displacement information, returned by the ASIC as a DC signal in two quadrature channels allowing the determination of linear position of the target scale. The microsystem design, simulations, and characterization are presented. Various system operating conditions such as frequency, phase, target scale material and distance have been experimentally evaluated. The best results have been achieved at 4 MHz, demonstrating a linear resolution of 20 µm with steel and copper scale, having respective sensitivities of 0.71 V/mm and 0.99 V/mm. MDPI 2016-03-17 /pmc/articles/PMC4813959/ /pubmed/26999146 http://dx.doi.org/10.3390/s16030384 Text en © 2016 by the authors; licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons by Attribution (CC-BY) license (http://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Article Podhraški, Matija Trontelj, Janez A Differential Monolithically Integrated Inductive Linear Displacement Measurement Microsystem |
title | A Differential Monolithically Integrated Inductive Linear Displacement Measurement Microsystem |
title_full | A Differential Monolithically Integrated Inductive Linear Displacement Measurement Microsystem |
title_fullStr | A Differential Monolithically Integrated Inductive Linear Displacement Measurement Microsystem |
title_full_unstemmed | A Differential Monolithically Integrated Inductive Linear Displacement Measurement Microsystem |
title_short | A Differential Monolithically Integrated Inductive Linear Displacement Measurement Microsystem |
title_sort | differential monolithically integrated inductive linear displacement measurement microsystem |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4813959/ https://www.ncbi.nlm.nih.gov/pubmed/26999146 http://dx.doi.org/10.3390/s16030384 |
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