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Charge Transfer Dynamics at Dye-Sensitized ZnO and TiO(2) Interfaces Studied by Ultrafast XUV Photoelectron Spectroscopy

Interfacial charge transfer from photoexcited ruthenium-based N3 dye molecules into ZnO thin films received controversial interpretations. To identify the physical origin for the delayed electron transfer in ZnO compared to TiO(2), we probe directly the electronic structure at both dye-semiconductor...

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Detalles Bibliográficos
Autores principales: Borgwardt, Mario, Wilke, Martin, Kampen, Thorsten, Mähl, Sven, Xiao, Manda, Spiccia, Leone, Lange, Kathrin M., Kiyan, Igor Yu., Aziz, Emad F.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2016
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4829909/
https://www.ncbi.nlm.nih.gov/pubmed/27073060
http://dx.doi.org/10.1038/srep24422
Descripción
Sumario:Interfacial charge transfer from photoexcited ruthenium-based N3 dye molecules into ZnO thin films received controversial interpretations. To identify the physical origin for the delayed electron transfer in ZnO compared to TiO(2), we probe directly the electronic structure at both dye-semiconductor interfaces by applying ultrafast XUV photoemission spectroscopy. In the range of pump-probe time delays between 0.5 to 1.0 ps, the transient signal of the intermediate states was compared, revealing a distinct difference in their electron binding energies of 0.4 eV. This finding strongly indicates the nature of the charge injection at the ZnO interface associated with the formation of an interfacial electron-cation complex. It further highlights that the energetic alignment between the dye donor and semiconductor acceptor states appears to be of minor importance for the injection kinetics and that the injection efficiency is dominated by the electronic coupling.