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Femtosecond few- to single-electron point-projection microscopy for nanoscale dynamic imaging
Femtosecond electron microscopy produces real-space images of matter in a series of ultrafast snapshots. Pulses of electrons self-disperse under space-charge broadening, so without compression, the ideal operation mode is a single electron per pulse. Here, we demonstrate femtosecond single-electron...
Autores principales: | , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
American Crystallographic Association
2016
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4841798/ https://www.ncbi.nlm.nih.gov/pubmed/27158637 http://dx.doi.org/10.1063/1.4947098 |
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author | Bainbridge, A. R. Barlow Myers, C. W. Bryan, W. A. |
author_facet | Bainbridge, A. R. Barlow Myers, C. W. Bryan, W. A. |
author_sort | Bainbridge, A. R. |
collection | PubMed |
description | Femtosecond electron microscopy produces real-space images of matter in a series of ultrafast snapshots. Pulses of electrons self-disperse under space-charge broadening, so without compression, the ideal operation mode is a single electron per pulse. Here, we demonstrate femtosecond single-electron point projection microscopy (fs-ePPM) in a laser-pump fs-e-probe configuration. The electrons have an energy of only 150 eV and take tens of picoseconds to propagate to the object under study. Nonetheless, we achieve a temporal resolution with a standard deviation of 114 fs (equivalent to a full-width at half-maximum of 269 ± 40 fs) combined with a spatial resolution of 100 nm, applied to a localized region of charge at the apex of a nanoscale metal tip induced by 30 fs 800 nm laser pulses at 50 kHz. These observations demonstrate real-space imaging of reversible processes, such as tracking charge distributions, is feasible whilst maintaining femtosecond resolution. Our findings could find application as a characterization method, which, depending on geometry, could resolve tens of femtoseconds and tens of nanometres. Dynamically imaging electric and magnetic fields and charge distributions on sub-micron length scales opens new avenues of ultrafast dynamics. Furthermore, through the use of active compression, such pulses are an ideal seed for few-femtosecond to attosecond imaging applications which will access sub-optical cycle processes in nanoplasmonics. |
format | Online Article Text |
id | pubmed-4841798 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2016 |
publisher | American Crystallographic Association |
record_format | MEDLINE/PubMed |
spelling | pubmed-48417982016-05-06 Femtosecond few- to single-electron point-projection microscopy for nanoscale dynamic imaging Bainbridge, A. R. Barlow Myers, C. W. Bryan, W. A. Struct Dyn SPECIAL TOPIC: SELECTED PAPERS FROM THE 3RD INTERNATIONAL CONFERENCE ON ULTRAFAST STRUCTURAL DYNAMICS Femtosecond electron microscopy produces real-space images of matter in a series of ultrafast snapshots. Pulses of electrons self-disperse under space-charge broadening, so without compression, the ideal operation mode is a single electron per pulse. Here, we demonstrate femtosecond single-electron point projection microscopy (fs-ePPM) in a laser-pump fs-e-probe configuration. The electrons have an energy of only 150 eV and take tens of picoseconds to propagate to the object under study. Nonetheless, we achieve a temporal resolution with a standard deviation of 114 fs (equivalent to a full-width at half-maximum of 269 ± 40 fs) combined with a spatial resolution of 100 nm, applied to a localized region of charge at the apex of a nanoscale metal tip induced by 30 fs 800 nm laser pulses at 50 kHz. These observations demonstrate real-space imaging of reversible processes, such as tracking charge distributions, is feasible whilst maintaining femtosecond resolution. Our findings could find application as a characterization method, which, depending on geometry, could resolve tens of femtoseconds and tens of nanometres. Dynamically imaging electric and magnetic fields and charge distributions on sub-micron length scales opens new avenues of ultrafast dynamics. Furthermore, through the use of active compression, such pulses are an ideal seed for few-femtosecond to attosecond imaging applications which will access sub-optical cycle processes in nanoplasmonics. American Crystallographic Association 2016-04-20 /pmc/articles/PMC4841798/ /pubmed/27158637 http://dx.doi.org/10.1063/1.4947098 Text en © 2016 Author(s). 2329-7778/2016/3(2)/023612/16 All article content, except where otherwise noted, is licensed under a Creative Commons Attribution 3.0 Unported License. |
spellingShingle | SPECIAL TOPIC: SELECTED PAPERS FROM THE 3RD INTERNATIONAL CONFERENCE ON ULTRAFAST STRUCTURAL DYNAMICS Bainbridge, A. R. Barlow Myers, C. W. Bryan, W. A. Femtosecond few- to single-electron point-projection microscopy for nanoscale dynamic imaging |
title | Femtosecond few- to single-electron point-projection microscopy for nanoscale dynamic imaging |
title_full | Femtosecond few- to single-electron point-projection microscopy for nanoscale dynamic imaging |
title_fullStr | Femtosecond few- to single-electron point-projection microscopy for nanoscale dynamic imaging |
title_full_unstemmed | Femtosecond few- to single-electron point-projection microscopy for nanoscale dynamic imaging |
title_short | Femtosecond few- to single-electron point-projection microscopy for nanoscale dynamic imaging |
title_sort | femtosecond few- to single-electron point-projection microscopy for nanoscale dynamic imaging |
topic | SPECIAL TOPIC: SELECTED PAPERS FROM THE 3RD INTERNATIONAL CONFERENCE ON ULTRAFAST STRUCTURAL DYNAMICS |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4841798/ https://www.ncbi.nlm.nih.gov/pubmed/27158637 http://dx.doi.org/10.1063/1.4947098 |
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