A comprehensive simulation framework for imaging single particles and biomolecules at the European X-ray Free-Electron Laser

The advent of newer, brighter, and more coherent X-ray sources, such as X-ray Free-Electron Lasers (XFELs), represents a tremendous growth in the potential to apply coherent X-rays to determine the structure of materials from the micron-scale down to the Angstrom-scale. There is a significant need f...

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Detalles Bibliográficos
Autores principales: Yoon, Chun Hong, Yurkov, Mikhail V., Schneidmiller, Evgeny A., Samoylova, Liubov, Buzmakov, Alexey, Jurek, Zoltan, Ziaja, Beata, Santra, Robin, Loh, N. Duane, Tschentscher, Thomas, Mancuso, Adrian P.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2016
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4842992/
https://www.ncbi.nlm.nih.gov/pubmed/27109208
http://dx.doi.org/10.1038/srep24791

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4842992/
https://www.ncbi.nlm.nih.gov/pubmed/27109208
http://dx.doi.org/10.1038/srep24791

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