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Temperature Dependence of the Hall and Longitudinal Resistances in a Quantum Hall Resistance Standard
We present detailed measurements of the temperature dependence of the Hall and longitudinal resistances on a quantum Hall device [(GaAs(7)] which has been used as a resistance standard at NIST. We find a simple power law relationship between the change in Hall resistance and the longitudinal resista...
Autores principales: | , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology
2005
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4847578/ https://www.ncbi.nlm.nih.gov/pubmed/27308175 http://dx.doi.org/10.6028/jres.110.078 |
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author | Matthews, J. Cage, M. E. |
author_facet | Matthews, J. Cage, M. E. |
author_sort | Matthews, J. |
collection | PubMed |
description | We present detailed measurements of the temperature dependence of the Hall and longitudinal resistances on a quantum Hall device [(GaAs(7)] which has been used as a resistance standard at NIST. We find a simple power law relationship between the change in Hall resistance and the longitudinal resistance as the temperature is varied between 1.4 K and 36 K. This power law holds over seven orders of magnitude change in the Hall resistance. We fit the temperature dependence above about 4 K to thermal activation, and extract the energy gap and the effective g-factor. |
format | Online Article Text |
id | pubmed-4847578 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2005 |
publisher | [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology |
record_format | MEDLINE/PubMed |
spelling | pubmed-48475782016-06-15 Temperature Dependence of the Hall and Longitudinal Resistances in a Quantum Hall Resistance Standard Matthews, J. Cage, M. E. J Res Natl Inst Stand Technol Article We present detailed measurements of the temperature dependence of the Hall and longitudinal resistances on a quantum Hall device [(GaAs(7)] which has been used as a resistance standard at NIST. We find a simple power law relationship between the change in Hall resistance and the longitudinal resistance as the temperature is varied between 1.4 K and 36 K. This power law holds over seven orders of magnitude change in the Hall resistance. We fit the temperature dependence above about 4 K to thermal activation, and extract the energy gap and the effective g-factor. [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 2005 2005-10-01 /pmc/articles/PMC4847578/ /pubmed/27308175 http://dx.doi.org/10.6028/jres.110.078 Text en https://creativecommons.org/publicdomain/zero/1.0/ The Journal of Research of the National Institute of Standards and Technology is a publication of the U.S. Government. The papers are in the public domain and are not subject to copyright in the United States. Articles from J Res may contain photographs or illustrations copyrighted by other commercial organizations or individuals that may not be used without obtaining prior approval from the holder of the copyright. |
spellingShingle | Article Matthews, J. Cage, M. E. Temperature Dependence of the Hall and Longitudinal Resistances in a Quantum Hall Resistance Standard |
title | Temperature Dependence of the Hall and Longitudinal Resistances in a Quantum Hall Resistance Standard |
title_full | Temperature Dependence of the Hall and Longitudinal Resistances in a Quantum Hall Resistance Standard |
title_fullStr | Temperature Dependence of the Hall and Longitudinal Resistances in a Quantum Hall Resistance Standard |
title_full_unstemmed | Temperature Dependence of the Hall and Longitudinal Resistances in a Quantum Hall Resistance Standard |
title_short | Temperature Dependence of the Hall and Longitudinal Resistances in a Quantum Hall Resistance Standard |
title_sort | temperature dependence of the hall and longitudinal resistances in a quantum hall resistance standard |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4847578/ https://www.ncbi.nlm.nih.gov/pubmed/27308175 http://dx.doi.org/10.6028/jres.110.078 |
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