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Frequency-Domain Models for Nonlinear Microwave Devices Based on Large-Signal Measurements
In this paper, we introduce nonlinear large-signal scattering ( [Formula: see text]) parameters, a new type of frequency-domain mapping that relates incident and reflected signals. We present a general form of nonlinear large-signal [Formula: see text]-parameters and show that they reduce to classic...
Autores principales: | , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology
2004
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4847587/ https://www.ncbi.nlm.nih.gov/pubmed/27366621 http://dx.doi.org/10.6028/jres.109.029 |
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author | Jargon, Jeffrey A. DeGroot, Donald C. Gupta, K. C. |
author_facet | Jargon, Jeffrey A. DeGroot, Donald C. Gupta, K. C. |
author_sort | Jargon, Jeffrey A. |
collection | PubMed |
description | In this paper, we introduce nonlinear large-signal scattering ( [Formula: see text]) parameters, a new type of frequency-domain mapping that relates incident and reflected signals. We present a general form of nonlinear large-signal [Formula: see text]-parameters and show that they reduce to classic [Formula: see text]-parameters in the absence of nonlinearities. Nonlinear large-signal impedance ( [Formula: see text]) and admittance ( [Formula: see text]) parameters are also introduced, and equations relating the different representations are derived. We illustrate how nonlinear large-signal [Formula: see text]-parameters can be used as a tool in the design process of a nonlinear circuit, specifically a single-diode 1 GHz frequency-doubler. For the case where a nonlinear model is not readily available, we developed a method of extracting nonlinear large-signal [Formula: see text]-parameters obtained with artificial neural network models trained with multiple measurements made by a nonlinear vector network analyzer equipped with two sources. Finally, nonlinear large-signal [Formula: see text]-parameters are compared to another form of nonlinear mapping, known as nonlinear scattering functions. The nonlinear large-signal [Formula: see text]-parameters are shown to be more general. |
format | Online Article Text |
id | pubmed-4847587 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2004 |
publisher | [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology |
record_format | MEDLINE/PubMed |
spelling | pubmed-48475872016-06-30 Frequency-Domain Models for Nonlinear Microwave Devices Based on Large-Signal Measurements Jargon, Jeffrey A. DeGroot, Donald C. Gupta, K. C. J Res Natl Inst Stand Technol Article In this paper, we introduce nonlinear large-signal scattering ( [Formula: see text]) parameters, a new type of frequency-domain mapping that relates incident and reflected signals. We present a general form of nonlinear large-signal [Formula: see text]-parameters and show that they reduce to classic [Formula: see text]-parameters in the absence of nonlinearities. Nonlinear large-signal impedance ( [Formula: see text]) and admittance ( [Formula: see text]) parameters are also introduced, and equations relating the different representations are derived. We illustrate how nonlinear large-signal [Formula: see text]-parameters can be used as a tool in the design process of a nonlinear circuit, specifically a single-diode 1 GHz frequency-doubler. For the case where a nonlinear model is not readily available, we developed a method of extracting nonlinear large-signal [Formula: see text]-parameters obtained with artificial neural network models trained with multiple measurements made by a nonlinear vector network analyzer equipped with two sources. Finally, nonlinear large-signal [Formula: see text]-parameters are compared to another form of nonlinear mapping, known as nonlinear scattering functions. The nonlinear large-signal [Formula: see text]-parameters are shown to be more general. [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 2004 2004-08-01 /pmc/articles/PMC4847587/ /pubmed/27366621 http://dx.doi.org/10.6028/jres.109.029 Text en https://creativecommons.org/publicdomain/zero/1.0/ The Journal of Research of the National Institute of Standards and Technology is a publication of the U.S. Government. The papers are in the public domain and are not subject to copyright in the United States. Articles from J Res may contain photographs or illustrations copyrighted by other commercial organizations or individuals that may not be used without obtaining prior approval from the holder of the copyright. |
spellingShingle | Article Jargon, Jeffrey A. DeGroot, Donald C. Gupta, K. C. Frequency-Domain Models for Nonlinear Microwave Devices Based on Large-Signal Measurements |
title | Frequency-Domain Models for Nonlinear Microwave Devices Based on Large-Signal Measurements |
title_full | Frequency-Domain Models for Nonlinear Microwave Devices Based on Large-Signal Measurements |
title_fullStr | Frequency-Domain Models for Nonlinear Microwave Devices Based on Large-Signal Measurements |
title_full_unstemmed | Frequency-Domain Models for Nonlinear Microwave Devices Based on Large-Signal Measurements |
title_short | Frequency-Domain Models for Nonlinear Microwave Devices Based on Large-Signal Measurements |
title_sort | frequency-domain models for nonlinear microwave devices based on large-signal measurements |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4847587/ https://www.ncbi.nlm.nih.gov/pubmed/27366621 http://dx.doi.org/10.6028/jres.109.029 |
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