Application of X-ray topography to USSR and Russian space materials science

The authors’ experience of the application of X-ray diffraction imaging in carrying out space technological experiments on semiconductor crystal growth for the former USSR and for Russia is reported, from the Apollo–Soyuz programme (1975) up to the present day. X-ray topography was applied to examin...

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Detalles Bibliográficos
Autores principales: Shul’pina, I. L., Prokhorov, I. A., Serebryakov, Yu. A., Bezbakh, I. Zh.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2016
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4856142/
https://www.ncbi.nlm.nih.gov/pubmed/27158506
http://dx.doi.org/10.1107/S2052252516003730

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