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Active Adoption of Void Formation in Metal-Oxide for All Transparent Super-Performing Photodetectors
Could ‘defect-considered’ void formation in metal-oxide be actively used? Is it possible to realize stable void formation in a metal-oxide layer, beyond unexpected observations, for functional utilization? Herein we demonstrate the effective tailoring of void formation of NiO for ultra-sensitive UV...
Autores principales: | Patel, Malkeshkumar, Kim, Hong-Sik, Park, Hyeong-Ho, Kim, Joondong |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group
2016
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4858702/ https://www.ncbi.nlm.nih.gov/pubmed/27151288 http://dx.doi.org/10.1038/srep25461 |
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