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Anisotropic elasticity of silicon and its application to the modelling of X-ray optics
The crystal lattice of single-crystal silicon gives rise to anisotropic elasticity. The stiffness and compliance coefficient matrix depend on crystal orientation and, consequently, Young’s modulus, the shear modulus and Poisson’s ratio as well. Computer codes (in Matlab and Python) have been develop...
Autores principales: | , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
International Union of Crystallography
2014
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4861878/ https://www.ncbi.nlm.nih.gov/pubmed/24763640 http://dx.doi.org/10.1107/S1600577514004962 |
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author | Zhang, Lin Barrett, Raymond Cloetens, Peter Detlefs, Carsten Sanchez del Rio, Manuel |
author_facet | Zhang, Lin Barrett, Raymond Cloetens, Peter Detlefs, Carsten Sanchez del Rio, Manuel |
author_sort | Zhang, Lin |
collection | PubMed |
description | The crystal lattice of single-crystal silicon gives rise to anisotropic elasticity. The stiffness and compliance coefficient matrix depend on crystal orientation and, consequently, Young’s modulus, the shear modulus and Poisson’s ratio as well. Computer codes (in Matlab and Python) have been developed to calculate these anisotropic elasticity parameters for a silicon crystal in any orientation. These codes facilitate the evaluation of these anisotropy effects in silicon for applications such as microelectronics, microelectromechanical systems and X-ray optics. For mechanically bent X-ray optics, it is shown that the silicon crystal orientation is an important factor which may significantly influence the optics design and manufacturing phase. Choosing the appropriate crystal orientation can both lead to improved performance whilst lowering mechanical bending stresses. The thermal deformation of the crystal depends on Poisson’s ratio. For an isotropic constant Poisson’s ratio, ν, the thermal deformation (RMS slope) is proportional to (1 + ν). For a cubic anisotropic material, the thermal deformation of the X-ray optics can be approximately simulated by using the average of ν(12) and ν(13) as an effective isotropic Poisson’s ratio, where the direction 1 is normal to the optic surface, and the directions 2 and 3 are two normal orthogonal directions parallel to the optical surface. This average is independent of the direction in the optical surface (the crystal plane) for Si(100), Si(110) and Si(111). Using the effective isotropic Poisson’s ratio for these orientations leads to an error in thermal deformation smaller than 5.5%. |
format | Online Article Text |
id | pubmed-4861878 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2014 |
publisher | International Union of Crystallography |
record_format | MEDLINE/PubMed |
spelling | pubmed-48618782016-06-08 Anisotropic elasticity of silicon and its application to the modelling of X-ray optics Zhang, Lin Barrett, Raymond Cloetens, Peter Detlefs, Carsten Sanchez del Rio, Manuel J Synchrotron Radiat Research Papers The crystal lattice of single-crystal silicon gives rise to anisotropic elasticity. The stiffness and compliance coefficient matrix depend on crystal orientation and, consequently, Young’s modulus, the shear modulus and Poisson’s ratio as well. Computer codes (in Matlab and Python) have been developed to calculate these anisotropic elasticity parameters for a silicon crystal in any orientation. These codes facilitate the evaluation of these anisotropy effects in silicon for applications such as microelectronics, microelectromechanical systems and X-ray optics. For mechanically bent X-ray optics, it is shown that the silicon crystal orientation is an important factor which may significantly influence the optics design and manufacturing phase. Choosing the appropriate crystal orientation can both lead to improved performance whilst lowering mechanical bending stresses. The thermal deformation of the crystal depends on Poisson’s ratio. For an isotropic constant Poisson’s ratio, ν, the thermal deformation (RMS slope) is proportional to (1 + ν). For a cubic anisotropic material, the thermal deformation of the X-ray optics can be approximately simulated by using the average of ν(12) and ν(13) as an effective isotropic Poisson’s ratio, where the direction 1 is normal to the optic surface, and the directions 2 and 3 are two normal orthogonal directions parallel to the optical surface. This average is independent of the direction in the optical surface (the crystal plane) for Si(100), Si(110) and Si(111). Using the effective isotropic Poisson’s ratio for these orientations leads to an error in thermal deformation smaller than 5.5%. International Union of Crystallography 2014-04-04 /pmc/articles/PMC4861878/ /pubmed/24763640 http://dx.doi.org/10.1107/S1600577514004962 Text en © Lin Zhang et al. 2014 http://creativecommons.org/licenses/by/2.0/uk/ This is an open-access article distributed under the terms of the Creative Commons Attribution Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited. |
spellingShingle | Research Papers Zhang, Lin Barrett, Raymond Cloetens, Peter Detlefs, Carsten Sanchez del Rio, Manuel Anisotropic elasticity of silicon and its application to the modelling of X-ray optics |
title | Anisotropic elasticity of silicon and its application to the modelling of X-ray optics |
title_full | Anisotropic elasticity of silicon and its application to the modelling of X-ray optics |
title_fullStr | Anisotropic elasticity of silicon and its application to the modelling of X-ray optics |
title_full_unstemmed | Anisotropic elasticity of silicon and its application to the modelling of X-ray optics |
title_short | Anisotropic elasticity of silicon and its application to the modelling of X-ray optics |
title_sort | anisotropic elasticity of silicon and its application to the modelling of x-ray optics |
topic | Research Papers |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4861878/ https://www.ncbi.nlm.nih.gov/pubmed/24763640 http://dx.doi.org/10.1107/S1600577514004962 |
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