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WORKSHOP ON TEXTURE IN ELECTRONIC APPLICATIONS Gaithersburg, MD October 10–11, 2000

Detalles Bibliográficos
Autores principales: Vaudin, Mark D., Kaiser, Debra L.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 2001
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4863835/
https://www.ncbi.nlm.nih.gov/pubmed/27500038
http://dx.doi.org/10.6028/jres.106.026
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author Vaudin, Mark D.
Kaiser, Debra L.
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Kaiser, Debra L.
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spelling pubmed-48638352016-08-05 WORKSHOP ON TEXTURE IN ELECTRONIC APPLICATIONS Gaithersburg, MD October 10–11, 2000 Vaudin, Mark D. Kaiser, Debra L. J Res Natl Inst Stand Technol Article [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 2001 2001-06-01 /pmc/articles/PMC4863835/ /pubmed/27500038 http://dx.doi.org/10.6028/jres.106.026 Text en https://creativecommons.org/publicdomain/zero/1.0/ The Journal of Research of the National Institute of Standards and Technology is a publication of the U.S. Government. The papers are in the public domain and are not subject to copyright in the United States. Articles from J Res may contain photographs or illustrations copyrighted by other commercial organizations or individuals that may not be used without obtaining prior approval from the holder of the copyright.
spellingShingle Article
Vaudin, Mark D.
Kaiser, Debra L.
WORKSHOP ON TEXTURE IN ELECTRONIC APPLICATIONS Gaithersburg, MD October 10–11, 2000
title WORKSHOP ON TEXTURE IN ELECTRONIC APPLICATIONS Gaithersburg, MD October 10–11, 2000
title_full WORKSHOP ON TEXTURE IN ELECTRONIC APPLICATIONS Gaithersburg, MD October 10–11, 2000
title_fullStr WORKSHOP ON TEXTURE IN ELECTRONIC APPLICATIONS Gaithersburg, MD October 10–11, 2000
title_full_unstemmed WORKSHOP ON TEXTURE IN ELECTRONIC APPLICATIONS Gaithersburg, MD October 10–11, 2000
title_short WORKSHOP ON TEXTURE IN ELECTRONIC APPLICATIONS Gaithersburg, MD October 10–11, 2000
title_sort workshop on texture in electronic applications gaithersburg, md october 10–11, 2000
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4863835/
https://www.ncbi.nlm.nih.gov/pubmed/27500038
http://dx.doi.org/10.6028/jres.106.026
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