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X-Ray Microanalysis in the Variable Pressure (Environmental) Scanning Electron Microscope
Electron-excited x-ray microanalysis performed in the variable pressure and environmental scanning electron microscopes is subject to additional artifacts beyond those encountered in the conventional scanning electron microscope. Gas scattering leads to direct contributions to the spectrum from the...
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology
2002
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4863848/ https://www.ncbi.nlm.nih.gov/pubmed/27446754 http://dx.doi.org/10.6028/jres.107.048 |