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The Microcalorimeter for Industrial Applications
To achieve the dramatic increases in x-ray spectral resolution (<20 eV at 1.5k eV) desired by market segments such as the semiconductor industry, NIST developed a transition-edge sensor (TES) microcalorimeter. To bring this exciting, yet demanding, new technology to the industrial users, certain...
Autores principales: | , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology
2002
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4863849/ https://www.ncbi.nlm.nih.gov/pubmed/27446756 http://dx.doi.org/10.6028/jres.107.050 |
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author | Redfern, Del Nicolosi, Joe Höhne, Jens Weiland, Rainer Simmnacher, Birgit Hollerich, Christian |
author_facet | Redfern, Del Nicolosi, Joe Höhne, Jens Weiland, Rainer Simmnacher, Birgit Hollerich, Christian |
author_sort | Redfern, Del |
collection | PubMed |
description | To achieve the dramatic increases in x-ray spectral resolution (<20 eV at 1.5k eV) desired by market segments such as the semiconductor industry, NIST developed a transition-edge sensor (TES) microcalorimeter. To bring this exciting, yet demanding, new technology to the industrial users, certain criteria must be addressed. Aspects of resolution, cooling and hold time, count rates as well as vibrations are considered. Data is presented to the present efforts to handle these issues as well as discussing development plans for the future. |
format | Online Article Text |
id | pubmed-4863849 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2002 |
publisher | [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology |
record_format | MEDLINE/PubMed |
spelling | pubmed-48638492016-07-21 The Microcalorimeter for Industrial Applications Redfern, Del Nicolosi, Joe Höhne, Jens Weiland, Rainer Simmnacher, Birgit Hollerich, Christian J Res Natl Inst Stand Technol Article To achieve the dramatic increases in x-ray spectral resolution (<20 eV at 1.5k eV) desired by market segments such as the semiconductor industry, NIST developed a transition-edge sensor (TES) microcalorimeter. To bring this exciting, yet demanding, new technology to the industrial users, certain criteria must be addressed. Aspects of resolution, cooling and hold time, count rates as well as vibrations are considered. Data is presented to the present efforts to handle these issues as well as discussing development plans for the future. [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 2002 2002-12-01 /pmc/articles/PMC4863849/ /pubmed/27446756 http://dx.doi.org/10.6028/jres.107.050 Text en https://creativecommons.org/publicdomain/zero/1.0/ The Journal of Research of the National Institute of Standards and Technology is a publication of the U.S. Government. The papers are in the public domain and are not subject to copyright in the United States. Articles from J Res may contain photographs or illustrations copyrighted by other commercial organizations or individuals that may not be used without obtaining prior approval from the holder of the copyright. |
spellingShingle | Article Redfern, Del Nicolosi, Joe Höhne, Jens Weiland, Rainer Simmnacher, Birgit Hollerich, Christian The Microcalorimeter for Industrial Applications |
title | The Microcalorimeter for Industrial Applications |
title_full | The Microcalorimeter for Industrial Applications |
title_fullStr | The Microcalorimeter for Industrial Applications |
title_full_unstemmed | The Microcalorimeter for Industrial Applications |
title_short | The Microcalorimeter for Industrial Applications |
title_sort | microcalorimeter for industrial applications |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4863849/ https://www.ncbi.nlm.nih.gov/pubmed/27446756 http://dx.doi.org/10.6028/jres.107.050 |
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