Implications of Polishing Techniques in Quantitative X-Ray Microanalysis

Specimen preparation using abrasives results in surface and subsurface mechanical (stresses, strains), geometrical (roughness), chemical (contaminants, reaction products) and physical modifications (structure, texture, lattice defects). The mechanisms involved in polishing with abrasives are present...

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Detalles Bibliográficos
Autores principales: Rémond, Guy, Nockolds, Clive, Phillips, Matthew, Roques-Carmes, Claude
Formato: Online Artículo Texto
Lenguaje:English
Publicado: [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 2002
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4863851/
https://www.ncbi.nlm.nih.gov/pubmed/27446758
http://dx.doi.org/10.6028/jres.107.052
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author Rémond, Guy
Nockolds, Clive
Phillips, Matthew
Roques-Carmes, Claude
author_facet Rémond, Guy
Nockolds, Clive
Phillips, Matthew
Roques-Carmes, Claude
author_sort Rémond, Guy
collection PubMed
description Specimen preparation using abrasives results in surface and subsurface mechanical (stresses, strains), geometrical (roughness), chemical (contaminants, reaction products) and physical modifications (structure, texture, lattice defects). The mechanisms involved in polishing with abrasives are presented to illustrate the effects of surface topography, surface and subsurface composition and induced lattice defects on the accuracy of quantitative x-ray microanalysis of mineral materials with the electron probe microanalyzer (EPMA).
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spelling pubmed-48638512016-07-21 Implications of Polishing Techniques in Quantitative X-Ray Microanalysis Rémond, Guy Nockolds, Clive Phillips, Matthew Roques-Carmes, Claude J Res Natl Inst Stand Technol Article Specimen preparation using abrasives results in surface and subsurface mechanical (stresses, strains), geometrical (roughness), chemical (contaminants, reaction products) and physical modifications (structure, texture, lattice defects). The mechanisms involved in polishing with abrasives are presented to illustrate the effects of surface topography, surface and subsurface composition and induced lattice defects on the accuracy of quantitative x-ray microanalysis of mineral materials with the electron probe microanalyzer (EPMA). [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 2002 2002-12-01 /pmc/articles/PMC4863851/ /pubmed/27446758 http://dx.doi.org/10.6028/jres.107.052 Text en https://creativecommons.org/publicdomain/zero/1.0/ The Journal of Research of the National Institute of Standards and Technology is a publication of the U.S. Government. The papers are in the public domain and are not subject to copyright in the United States. Articles from J Res may contain photographs or illustrations copyrighted by other commercial organizations or individuals that may not be used without obtaining prior approval from the holder of the copyright.
spellingShingle Article
Rémond, Guy
Nockolds, Clive
Phillips, Matthew
Roques-Carmes, Claude
Implications of Polishing Techniques in Quantitative X-Ray Microanalysis
title Implications of Polishing Techniques in Quantitative X-Ray Microanalysis
title_full Implications of Polishing Techniques in Quantitative X-Ray Microanalysis
title_fullStr Implications of Polishing Techniques in Quantitative X-Ray Microanalysis
title_full_unstemmed Implications of Polishing Techniques in Quantitative X-Ray Microanalysis
title_short Implications of Polishing Techniques in Quantitative X-Ray Microanalysis
title_sort implications of polishing techniques in quantitative x-ray microanalysis
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4863851/
https://www.ncbi.nlm.nih.gov/pubmed/27446758
http://dx.doi.org/10.6028/jres.107.052
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