Removal of electrostatic artifacts in magnetic force microscopy by controlled magnetization of the tip: application to superparamagnetic nanoparticles

Magnetic force microscopy (MFM) has been demonstrated as valuable technique for the characterization of magnetic nanomaterials. To be analyzed by MFM techniques, nanomaterials are generally deposited on flat substrates, resulting in an additional contrast in MFM images due to unavoidable heterogeneo...

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Detalles Bibliográficos
Autores principales: Angeloni, Livia, Passeri, Daniele, Reggente, Melania, Mantovani, Diego, Rossi, Marco
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2016
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4872042/
https://www.ncbi.nlm.nih.gov/pubmed/27194591
http://dx.doi.org/10.1038/srep26293

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4872042/
https://www.ncbi.nlm.nih.gov/pubmed/27194591
http://dx.doi.org/10.1038/srep26293

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