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Noise-Optimized Silicon Radiometers
This paper describes a new, experimentally verified, noise analysis and the design considerations of the dynamic characteristics of silicon radiometers. Transimpedance gain, loop gain, and voltage gain were optimized versus frequency for photodiode current meters measuring ac and dc optical radiatio...
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology
2000
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Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4872682/ https://www.ncbi.nlm.nih.gov/pubmed/27551606 http://dx.doi.org/10.6028/jres.105.027 |
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author | Eppeldauer, George P. |
author_facet | Eppeldauer, George P. |
author_sort | Eppeldauer, George P. |
collection | PubMed |
description | This paper describes a new, experimentally verified, noise analysis and the design considerations of the dynamic characteristics of silicon radiometers. Transimpedance gain, loop gain, and voltage gain were optimized versus frequency for photodiode current meters measuring ac and dc optical radiation. Silicon radiometers with improved dynamic characteristics were built and tested. The frequency-dependent photocurrent gains were measured. The noise floor was optimized in an ac measurement mode using photodiodes of different shunt resistance and operational amplifiers with low 1/f voltage and current noise. In the dark (without any signal), the noise floor of the optimized silicon radiometers was dominated by the Johnson noise of the source resistance. The Johnson noise was decreased and equalized to the amplified 1/f input noise at a 9 Hz chopping frequency and 30 s integration time constant, resulting in an equivalent root-mean-square (rms) photocurrent noise of 8 × 10(−17) A. The lowest noise floor of 5 × 10(−17) A, equal to a noise equivalent power (NEP) of 1.4 × 10(−16) W at the 730 nm peak responsivity, was obtained at a 100 s integration time constant. The radiometers, optimized for ac measurements, were tested in a dc measurement mode as well. Performances in ac and dc measurement modes were compared. In the ac mode, a ten times shorter (40 s) overall measurement time was needed than in the dc mode (400 s) to obtain the same 10(−16) A noise floor. |
format | Online Article Text |
id | pubmed-4872682 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2000 |
publisher | [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology |
record_format | MEDLINE/PubMed |
spelling | pubmed-48726822016-08-22 Noise-Optimized Silicon Radiometers Eppeldauer, George P. J Res Natl Inst Stand Technol Article This paper describes a new, experimentally verified, noise analysis and the design considerations of the dynamic characteristics of silicon radiometers. Transimpedance gain, loop gain, and voltage gain were optimized versus frequency for photodiode current meters measuring ac and dc optical radiation. Silicon radiometers with improved dynamic characteristics were built and tested. The frequency-dependent photocurrent gains were measured. The noise floor was optimized in an ac measurement mode using photodiodes of different shunt resistance and operational amplifiers with low 1/f voltage and current noise. In the dark (without any signal), the noise floor of the optimized silicon radiometers was dominated by the Johnson noise of the source resistance. The Johnson noise was decreased and equalized to the amplified 1/f input noise at a 9 Hz chopping frequency and 30 s integration time constant, resulting in an equivalent root-mean-square (rms) photocurrent noise of 8 × 10(−17) A. The lowest noise floor of 5 × 10(−17) A, equal to a noise equivalent power (NEP) of 1.4 × 10(−16) W at the 730 nm peak responsivity, was obtained at a 100 s integration time constant. The radiometers, optimized for ac measurements, were tested in a dc measurement mode as well. Performances in ac and dc measurement modes were compared. In the ac mode, a ten times shorter (40 s) overall measurement time was needed than in the dc mode (400 s) to obtain the same 10(−16) A noise floor. [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 2000 2000-04-01 /pmc/articles/PMC4872682/ /pubmed/27551606 http://dx.doi.org/10.6028/jres.105.027 Text en https://creativecommons.org/publicdomain/zero/1.0/ The Journal of Research of the National Institute of Standards and Technology is a publication of the U.S. Government. The papers are in the public domain and are not subject to copyright in the United States. Articles from J Res may contain photographs or illustrations copyrighted by other commercial organizations or individuals that may not be used without obtaining prior approval from the holder of the copyright. |
spellingShingle | Article Eppeldauer, George P. Noise-Optimized Silicon Radiometers |
title | Noise-Optimized Silicon Radiometers |
title_full | Noise-Optimized Silicon Radiometers |
title_fullStr | Noise-Optimized Silicon Radiometers |
title_full_unstemmed | Noise-Optimized Silicon Radiometers |
title_short | Noise-Optimized Silicon Radiometers |
title_sort | noise-optimized silicon radiometers |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4872682/ https://www.ncbi.nlm.nih.gov/pubmed/27551606 http://dx.doi.org/10.6028/jres.105.027 |
work_keys_str_mv | AT eppeldauergeorgep noiseoptimizedsiliconradiometers |