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Noise-Optimized Silicon Radiometers

This paper describes a new, experimentally verified, noise analysis and the design considerations of the dynamic characteristics of silicon radiometers. Transimpedance gain, loop gain, and voltage gain were optimized versus frequency for photodiode current meters measuring ac and dc optical radiatio...

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Autor principal: Eppeldauer, George P.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 2000
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4872682/
https://www.ncbi.nlm.nih.gov/pubmed/27551606
http://dx.doi.org/10.6028/jres.105.027
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author Eppeldauer, George P.
author_facet Eppeldauer, George P.
author_sort Eppeldauer, George P.
collection PubMed
description This paper describes a new, experimentally verified, noise analysis and the design considerations of the dynamic characteristics of silicon radiometers. Transimpedance gain, loop gain, and voltage gain were optimized versus frequency for photodiode current meters measuring ac and dc optical radiation. Silicon radiometers with improved dynamic characteristics were built and tested. The frequency-dependent photocurrent gains were measured. The noise floor was optimized in an ac measurement mode using photodiodes of different shunt resistance and operational amplifiers with low 1/f voltage and current noise. In the dark (without any signal), the noise floor of the optimized silicon radiometers was dominated by the Johnson noise of the source resistance. The Johnson noise was decreased and equalized to the amplified 1/f input noise at a 9 Hz chopping frequency and 30 s integration time constant, resulting in an equivalent root-mean-square (rms) photocurrent noise of 8 × 10(−17) A. The lowest noise floor of 5 × 10(−17) A, equal to a noise equivalent power (NEP) of 1.4 × 10(−16) W at the 730 nm peak responsivity, was obtained at a 100 s integration time constant. The radiometers, optimized for ac measurements, were tested in a dc measurement mode as well. Performances in ac and dc measurement modes were compared. In the ac mode, a ten times shorter (40 s) overall measurement time was needed than in the dc mode (400 s) to obtain the same 10(−16) A noise floor.
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spelling pubmed-48726822016-08-22 Noise-Optimized Silicon Radiometers Eppeldauer, George P. J Res Natl Inst Stand Technol Article This paper describes a new, experimentally verified, noise analysis and the design considerations of the dynamic characteristics of silicon radiometers. Transimpedance gain, loop gain, and voltage gain were optimized versus frequency for photodiode current meters measuring ac and dc optical radiation. Silicon radiometers with improved dynamic characteristics were built and tested. The frequency-dependent photocurrent gains were measured. The noise floor was optimized in an ac measurement mode using photodiodes of different shunt resistance and operational amplifiers with low 1/f voltage and current noise. In the dark (without any signal), the noise floor of the optimized silicon radiometers was dominated by the Johnson noise of the source resistance. The Johnson noise was decreased and equalized to the amplified 1/f input noise at a 9 Hz chopping frequency and 30 s integration time constant, resulting in an equivalent root-mean-square (rms) photocurrent noise of 8 × 10(−17) A. The lowest noise floor of 5 × 10(−17) A, equal to a noise equivalent power (NEP) of 1.4 × 10(−16) W at the 730 nm peak responsivity, was obtained at a 100 s integration time constant. The radiometers, optimized for ac measurements, were tested in a dc measurement mode as well. Performances in ac and dc measurement modes were compared. In the ac mode, a ten times shorter (40 s) overall measurement time was needed than in the dc mode (400 s) to obtain the same 10(−16) A noise floor. [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 2000 2000-04-01 /pmc/articles/PMC4872682/ /pubmed/27551606 http://dx.doi.org/10.6028/jres.105.027 Text en https://creativecommons.org/publicdomain/zero/1.0/ The Journal of Research of the National Institute of Standards and Technology is a publication of the U.S. Government. The papers are in the public domain and are not subject to copyright in the United States. Articles from J Res may contain photographs or illustrations copyrighted by other commercial organizations or individuals that may not be used without obtaining prior approval from the holder of the copyright.
spellingShingle Article
Eppeldauer, George P.
Noise-Optimized Silicon Radiometers
title Noise-Optimized Silicon Radiometers
title_full Noise-Optimized Silicon Radiometers
title_fullStr Noise-Optimized Silicon Radiometers
title_full_unstemmed Noise-Optimized Silicon Radiometers
title_short Noise-Optimized Silicon Radiometers
title_sort noise-optimized silicon radiometers
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4872682/
https://www.ncbi.nlm.nih.gov/pubmed/27551606
http://dx.doi.org/10.6028/jres.105.027
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