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Measuring Lattice Strain in Three Dimensions through Electron Microscopy

[Image: see text] The three-dimensional (3D) atomic structure of nanomaterials, including strain, is crucial to understand their properties. Here, we investigate lattice strain in Au nanodecahedra using electron tomography. Although different electron tomography techniques enabled 3D characterizatio...

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Autores principales: Goris, Bart, De Beenhouwer, Jan, De Backer, Annick, Zanaga, Daniele, Batenburg, K. Joost, Sánchez-Iglesias, Ana, Liz-Marzán, Luis M., Van Aert, Sandra, Bals, Sara, Sijbers, Jan, Van Tendeloo, Gustaaf
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2015
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4877113/
https://www.ncbi.nlm.nih.gov/pubmed/26340328
http://dx.doi.org/10.1021/acs.nanolett.5b03008
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author Goris, Bart
De Beenhouwer, Jan
De Backer, Annick
Zanaga, Daniele
Batenburg, K. Joost
Sánchez-Iglesias, Ana
Liz-Marzán, Luis M.
Van Aert, Sandra
Bals, Sara
Sijbers, Jan
Van Tendeloo, Gustaaf
author_facet Goris, Bart
De Beenhouwer, Jan
De Backer, Annick
Zanaga, Daniele
Batenburg, K. Joost
Sánchez-Iglesias, Ana
Liz-Marzán, Luis M.
Van Aert, Sandra
Bals, Sara
Sijbers, Jan
Van Tendeloo, Gustaaf
author_sort Goris, Bart
collection PubMed
description [Image: see text] The three-dimensional (3D) atomic structure of nanomaterials, including strain, is crucial to understand their properties. Here, we investigate lattice strain in Au nanodecahedra using electron tomography. Although different electron tomography techniques enabled 3D characterizations of nanostructures at the atomic level, a reliable determination of lattice strain is not straightforward. We therefore propose a novel model-based approach from which atomic coordinates are measured. Our findings demonstrate the importance of investigating lattice strain in 3D.
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spelling pubmed-48771132016-05-24 Measuring Lattice Strain in Three Dimensions through Electron Microscopy Goris, Bart De Beenhouwer, Jan De Backer, Annick Zanaga, Daniele Batenburg, K. Joost Sánchez-Iglesias, Ana Liz-Marzán, Luis M. Van Aert, Sandra Bals, Sara Sijbers, Jan Van Tendeloo, Gustaaf Nano Lett [Image: see text] The three-dimensional (3D) atomic structure of nanomaterials, including strain, is crucial to understand their properties. Here, we investigate lattice strain in Au nanodecahedra using electron tomography. Although different electron tomography techniques enabled 3D characterizations of nanostructures at the atomic level, a reliable determination of lattice strain is not straightforward. We therefore propose a novel model-based approach from which atomic coordinates are measured. Our findings demonstrate the importance of investigating lattice strain in 3D. American Chemical Society 2015-09-04 2015-10-14 /pmc/articles/PMC4877113/ /pubmed/26340328 http://dx.doi.org/10.1021/acs.nanolett.5b03008 Text en Copyright © 2015 American Chemical Society This is an open access article published under an ACS AuthorChoice License (http://pubs.acs.org/page/policy/authorchoice_termsofuse.html) , which permits copying and redistribution of the article or any adaptations for non-commercial purposes.
spellingShingle Goris, Bart
De Beenhouwer, Jan
De Backer, Annick
Zanaga, Daniele
Batenburg, K. Joost
Sánchez-Iglesias, Ana
Liz-Marzán, Luis M.
Van Aert, Sandra
Bals, Sara
Sijbers, Jan
Van Tendeloo, Gustaaf
Measuring Lattice Strain in Three Dimensions through Electron Microscopy
title Measuring Lattice Strain in Three Dimensions through Electron Microscopy
title_full Measuring Lattice Strain in Three Dimensions through Electron Microscopy
title_fullStr Measuring Lattice Strain in Three Dimensions through Electron Microscopy
title_full_unstemmed Measuring Lattice Strain in Three Dimensions through Electron Microscopy
title_short Measuring Lattice Strain in Three Dimensions through Electron Microscopy
title_sort measuring lattice strain in three dimensions through electron microscopy
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4877113/
https://www.ncbi.nlm.nih.gov/pubmed/26340328
http://dx.doi.org/10.1021/acs.nanolett.5b03008
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