Application of GRID to Foreign Atom Localization in Single Crystals

The application of GRID (Gamma Ray Induced Doppler broadening) spectroscopy to the localization of foreign atoms in single crystals is demonstrated on erbium in YAP. By the investigation of the Doppler broadened secondary γ line for two crystalline directions, the Er was determined to be localized o...

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Detalles Bibliográficos
Autores principales: Karmann, A., Wesch, W., Weber, B., Börner, H. G., Jentschel, M.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 2000
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4878348/
https://www.ncbi.nlm.nih.gov/pubmed/27551605
http://dx.doi.org/10.6028/jres.105.025
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author Karmann, A.
Wesch, W.
Weber, B.
Börner, H. G.
Jentschel, M.
author_facet Karmann, A.
Wesch, W.
Weber, B.
Börner, H. G.
Jentschel, M.
author_sort Karmann, A.
collection PubMed
description The application of GRID (Gamma Ray Induced Doppler broadening) spectroscopy to the localization of foreign atoms in single crystals is demonstrated on erbium in YAP. By the investigation of the Doppler broadened secondary γ line for two crystalline directions, the Er was determined to be localized on the Y site. Conditions for the nuclear parameters of the impurity atoms used for the application of GRID spectroscopy are discussed.
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spelling pubmed-48783482016-08-22 Application of GRID to Foreign Atom Localization in Single Crystals Karmann, A. Wesch, W. Weber, B. Börner, H. G. Jentschel, M. J Res Natl Inst Stand Technol Article The application of GRID (Gamma Ray Induced Doppler broadening) spectroscopy to the localization of foreign atoms in single crystals is demonstrated on erbium in YAP. By the investigation of the Doppler broadened secondary γ line for two crystalline directions, the Er was determined to be localized on the Y site. Conditions for the nuclear parameters of the impurity atoms used for the application of GRID spectroscopy are discussed. [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 2000 2000-02-01 /pmc/articles/PMC4878348/ /pubmed/27551605 http://dx.doi.org/10.6028/jres.105.025 Text en https://creativecommons.org/publicdomain/zero/1.0/ The Journal of Research of the National Institute of Standards and Technology is a publication of the U.S. Government. The papers are in the public domain and are not subject to copyright in the United States. Articles from J Res may contain photographs or illustrations copyrighted by other commercial organizations or individuals that may not be used without obtaining prior approval from the holder of the copyright.
spellingShingle Article
Karmann, A.
Wesch, W.
Weber, B.
Börner, H. G.
Jentschel, M.
Application of GRID to Foreign Atom Localization in Single Crystals
title Application of GRID to Foreign Atom Localization in Single Crystals
title_full Application of GRID to Foreign Atom Localization in Single Crystals
title_fullStr Application of GRID to Foreign Atom Localization in Single Crystals
title_full_unstemmed Application of GRID to Foreign Atom Localization in Single Crystals
title_short Application of GRID to Foreign Atom Localization in Single Crystals
title_sort application of grid to foreign atom localization in single crystals
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4878348/
https://www.ncbi.nlm.nih.gov/pubmed/27551605
http://dx.doi.org/10.6028/jres.105.025
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AT jentschelm applicationofgridtoforeignatomlocalizationinsinglecrystals

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