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Evolution of electronic states in n-type copper oxide superconductor via electric double layer gating

The occurrence of electrons and holes in n-type copper oxides has been achieved by chemical doping, pressure, and/or deoxygenation. However, the observed electronic properties are blurred by the concomitant effects such as change of lattice structure, disorder, etc. Here, we report on successful tun...

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Autores principales: Jin, Kui, Hu, Wei, Zhu, Beiyi, Kim, Dohun, Yuan, Jie, Sun, Yujie, Xiang, Tao, Fuhrer, Michael S., Takeuchi, Ichiro, Greene, Richard. L.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2016
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4879525/
https://www.ncbi.nlm.nih.gov/pubmed/27221198
http://dx.doi.org/10.1038/srep26642
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author Jin, Kui
Hu, Wei
Zhu, Beiyi
Kim, Dohun
Yuan, Jie
Sun, Yujie
Xiang, Tao
Fuhrer, Michael S.
Takeuchi, Ichiro
Greene, Richard. L.
author_facet Jin, Kui
Hu, Wei
Zhu, Beiyi
Kim, Dohun
Yuan, Jie
Sun, Yujie
Xiang, Tao
Fuhrer, Michael S.
Takeuchi, Ichiro
Greene, Richard. L.
author_sort Jin, Kui
collection PubMed
description The occurrence of electrons and holes in n-type copper oxides has been achieved by chemical doping, pressure, and/or deoxygenation. However, the observed electronic properties are blurred by the concomitant effects such as change of lattice structure, disorder, etc. Here, we report on successful tuning the electronic band structure of n-type Pr(2−x)Ce(x)CuO(4) (x = 0.15) ultrathin films, via the electric double layer transistor technique. Abnormal transport properties, such as multiple sign reversals of Hall resistivity in normal and mixed states, have been revealed within an electrostatic field in range of −2 V to + 2 V, as well as varying the temperature and magnetic field. In the mixed state, the intrinsic anomalous Hall conductivity invokes the contribution of both electron and hole-bands as well as the energy dependent density of states near the Fermi level. The two-band model can also describe the normal state transport properties well, whereas the carrier concentrations of electrons and holes are always enhanced or depressed simultaneously in electric fields. This is in contrast to the scenario of Fermi surface reconstruction by antiferromagnetism, where an anti-correlation is commonly expected.
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spelling pubmed-48795252016-06-08 Evolution of electronic states in n-type copper oxide superconductor via electric double layer gating Jin, Kui Hu, Wei Zhu, Beiyi Kim, Dohun Yuan, Jie Sun, Yujie Xiang, Tao Fuhrer, Michael S. Takeuchi, Ichiro Greene, Richard. L. Sci Rep Article The occurrence of electrons and holes in n-type copper oxides has been achieved by chemical doping, pressure, and/or deoxygenation. However, the observed electronic properties are blurred by the concomitant effects such as change of lattice structure, disorder, etc. Here, we report on successful tuning the electronic band structure of n-type Pr(2−x)Ce(x)CuO(4) (x = 0.15) ultrathin films, via the electric double layer transistor technique. Abnormal transport properties, such as multiple sign reversals of Hall resistivity in normal and mixed states, have been revealed within an electrostatic field in range of −2 V to + 2 V, as well as varying the temperature and magnetic field. In the mixed state, the intrinsic anomalous Hall conductivity invokes the contribution of both electron and hole-bands as well as the energy dependent density of states near the Fermi level. The two-band model can also describe the normal state transport properties well, whereas the carrier concentrations of electrons and holes are always enhanced or depressed simultaneously in electric fields. This is in contrast to the scenario of Fermi surface reconstruction by antiferromagnetism, where an anti-correlation is commonly expected. Nature Publishing Group 2016-05-25 /pmc/articles/PMC4879525/ /pubmed/27221198 http://dx.doi.org/10.1038/srep26642 Text en Copyright © 2016, Macmillan Publishers Limited http://creativecommons.org/licenses/by/4.0/ This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/
spellingShingle Article
Jin, Kui
Hu, Wei
Zhu, Beiyi
Kim, Dohun
Yuan, Jie
Sun, Yujie
Xiang, Tao
Fuhrer, Michael S.
Takeuchi, Ichiro
Greene, Richard. L.
Evolution of electronic states in n-type copper oxide superconductor via electric double layer gating
title Evolution of electronic states in n-type copper oxide superconductor via electric double layer gating
title_full Evolution of electronic states in n-type copper oxide superconductor via electric double layer gating
title_fullStr Evolution of electronic states in n-type copper oxide superconductor via electric double layer gating
title_full_unstemmed Evolution of electronic states in n-type copper oxide superconductor via electric double layer gating
title_short Evolution of electronic states in n-type copper oxide superconductor via electric double layer gating
title_sort evolution of electronic states in n-type copper oxide superconductor via electric double layer gating
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4879525/
https://www.ncbi.nlm.nih.gov/pubmed/27221198
http://dx.doi.org/10.1038/srep26642
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