Cargando…
Analyzing the Effects of Capacitances-to-Shield in Sample Probes on AC Quantized Hall Resistance Measurements
We analyze the effects of the large capacitances-to-shields existing in all sample probes on measurements of the ac quantized Hall resistance R(H). The object of this analysis is to investigate how these capacitances affect the observed frequency dependence of R(H). Our goal is to see if there is so...
Autores principales: | , |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology
1999
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4880402/ http://dx.doi.org/10.6028/jres.104.023 |
_version_ | 1782433798807355392 |
---|---|
author | Cage, M. E. Jeffery, A. |
author_facet | Cage, M. E. Jeffery, A. |
author_sort | Cage, M. E. |
collection | PubMed |
description | We analyze the effects of the large capacitances-to-shields existing in all sample probes on measurements of the ac quantized Hall resistance R(H). The object of this analysis is to investigate how these capacitances affect the observed frequency dependence of R(H). Our goal is to see if there is some way to eliminate or minimize this significant frequency dependence, and thereby realize an intrinsic ac quantized Hall resistance standard. Equivalent electrical circuits are used in this analysis, with circuit components consisting of: capacitances and leakage resistances to the sample probe shields; inductances and resistances of the sample probe leads; quantized Hall resistances, longitudinal resistances, and voltage generators within the quantum Hall effect device; and multiple connections to the device. We derive exact algebraic equations for the measured R(H) values expressed in terms of the circuit components. Only two circuits (with single-series “offset” and quadruple-series connections) appear to meet our desired goals of measuring both R(H) and the longitudinal resistance R(x) in the same cool-down for both ac and dc currents with a one-standard-deviation uncertainty of 10(−8) R(H) or less. These two circuits will be further considered in a future paper in which the effects of wire-to-wire capacitances are also included in the analysis. |
format | Online Article Text |
id | pubmed-4880402 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 1999 |
publisher | [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology |
record_format | MEDLINE/PubMed |
spelling | pubmed-48804022016-09-06 Analyzing the Effects of Capacitances-to-Shield in Sample Probes on AC Quantized Hall Resistance Measurements Cage, M. E. Jeffery, A. J Res Natl Inst Stand Technol Article We analyze the effects of the large capacitances-to-shields existing in all sample probes on measurements of the ac quantized Hall resistance R(H). The object of this analysis is to investigate how these capacitances affect the observed frequency dependence of R(H). Our goal is to see if there is some way to eliminate or minimize this significant frequency dependence, and thereby realize an intrinsic ac quantized Hall resistance standard. Equivalent electrical circuits are used in this analysis, with circuit components consisting of: capacitances and leakage resistances to the sample probe shields; inductances and resistances of the sample probe leads; quantized Hall resistances, longitudinal resistances, and voltage generators within the quantum Hall effect device; and multiple connections to the device. We derive exact algebraic equations for the measured R(H) values expressed in terms of the circuit components. Only two circuits (with single-series “offset” and quadruple-series connections) appear to meet our desired goals of measuring both R(H) and the longitudinal resistance R(x) in the same cool-down for both ac and dc currents with a one-standard-deviation uncertainty of 10(−8) R(H) or less. These two circuits will be further considered in a future paper in which the effects of wire-to-wire capacitances are also included in the analysis. [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 1999 1999-08-01 /pmc/articles/PMC4880402/ http://dx.doi.org/10.6028/jres.104.023 Text en https://creativecommons.org/publicdomain/zero/1.0/ The Journal of Research of the National Institute of Standards and Technology is a publication of the U.S. Government. The papers are in the public domain and are not subject to copyright in the United States. Articles from J Res may contain photographs or illustrations copyrighted by other commercial organizations or individuals that may not be used without obtaining prior approval from the holder of the copyright. |
spellingShingle | Article Cage, M. E. Jeffery, A. Analyzing the Effects of Capacitances-to-Shield in Sample Probes on AC Quantized Hall Resistance Measurements |
title | Analyzing the Effects of Capacitances-to-Shield in Sample Probes on AC Quantized Hall Resistance Measurements |
title_full | Analyzing the Effects of Capacitances-to-Shield in Sample Probes on AC Quantized Hall Resistance Measurements |
title_fullStr | Analyzing the Effects of Capacitances-to-Shield in Sample Probes on AC Quantized Hall Resistance Measurements |
title_full_unstemmed | Analyzing the Effects of Capacitances-to-Shield in Sample Probes on AC Quantized Hall Resistance Measurements |
title_short | Analyzing the Effects of Capacitances-to-Shield in Sample Probes on AC Quantized Hall Resistance Measurements |
title_sort | analyzing the effects of capacitances-to-shield in sample probes on ac quantized hall resistance measurements |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4880402/ http://dx.doi.org/10.6028/jres.104.023 |
work_keys_str_mv | AT cageme analyzingtheeffectsofcapacitancestoshieldinsampleprobesonacquantizedhallresistancemeasurements AT jefferya analyzingtheeffectsofcapacitancestoshieldinsampleprobesonacquantizedhallresistancemeasurements |