Cargando…

Analyzing the Effects of Capacitances-to-Shield in Sample Probes on AC Quantized Hall Resistance Measurements

We analyze the effects of the large capacitances-to-shields existing in all sample probes on measurements of the ac quantized Hall resistance R(H). The object of this analysis is to investigate how these capacitances affect the observed frequency dependence of R(H). Our goal is to see if there is so...

Descripción completa

Detalles Bibliográficos
Autores principales: Cage, M. E., Jeffery, A.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 1999
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4880402/
http://dx.doi.org/10.6028/jres.104.023
_version_ 1782433798807355392
author Cage, M. E.
Jeffery, A.
author_facet Cage, M. E.
Jeffery, A.
author_sort Cage, M. E.
collection PubMed
description We analyze the effects of the large capacitances-to-shields existing in all sample probes on measurements of the ac quantized Hall resistance R(H). The object of this analysis is to investigate how these capacitances affect the observed frequency dependence of R(H). Our goal is to see if there is some way to eliminate or minimize this significant frequency dependence, and thereby realize an intrinsic ac quantized Hall resistance standard. Equivalent electrical circuits are used in this analysis, with circuit components consisting of: capacitances and leakage resistances to the sample probe shields; inductances and resistances of the sample probe leads; quantized Hall resistances, longitudinal resistances, and voltage generators within the quantum Hall effect device; and multiple connections to the device. We derive exact algebraic equations for the measured R(H) values expressed in terms of the circuit components. Only two circuits (with single-series “offset” and quadruple-series connections) appear to meet our desired goals of measuring both R(H) and the longitudinal resistance R(x) in the same cool-down for both ac and dc currents with a one-standard-deviation uncertainty of 10(−8) R(H) or less. These two circuits will be further considered in a future paper in which the effects of wire-to-wire capacitances are also included in the analysis.
format Online
Article
Text
id pubmed-4880402
institution National Center for Biotechnology Information
language English
publishDate 1999
publisher [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology
record_format MEDLINE/PubMed
spelling pubmed-48804022016-09-06 Analyzing the Effects of Capacitances-to-Shield in Sample Probes on AC Quantized Hall Resistance Measurements Cage, M. E. Jeffery, A. J Res Natl Inst Stand Technol Article We analyze the effects of the large capacitances-to-shields existing in all sample probes on measurements of the ac quantized Hall resistance R(H). The object of this analysis is to investigate how these capacitances affect the observed frequency dependence of R(H). Our goal is to see if there is some way to eliminate or minimize this significant frequency dependence, and thereby realize an intrinsic ac quantized Hall resistance standard. Equivalent electrical circuits are used in this analysis, with circuit components consisting of: capacitances and leakage resistances to the sample probe shields; inductances and resistances of the sample probe leads; quantized Hall resistances, longitudinal resistances, and voltage generators within the quantum Hall effect device; and multiple connections to the device. We derive exact algebraic equations for the measured R(H) values expressed in terms of the circuit components. Only two circuits (with single-series “offset” and quadruple-series connections) appear to meet our desired goals of measuring both R(H) and the longitudinal resistance R(x) in the same cool-down for both ac and dc currents with a one-standard-deviation uncertainty of 10(−8) R(H) or less. These two circuits will be further considered in a future paper in which the effects of wire-to-wire capacitances are also included in the analysis. [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 1999 1999-08-01 /pmc/articles/PMC4880402/ http://dx.doi.org/10.6028/jres.104.023 Text en https://creativecommons.org/publicdomain/zero/1.0/ The Journal of Research of the National Institute of Standards and Technology is a publication of the U.S. Government. The papers are in the public domain and are not subject to copyright in the United States. Articles from J Res may contain photographs or illustrations copyrighted by other commercial organizations or individuals that may not be used without obtaining prior approval from the holder of the copyright.
spellingShingle Article
Cage, M. E.
Jeffery, A.
Analyzing the Effects of Capacitances-to-Shield in Sample Probes on AC Quantized Hall Resistance Measurements
title Analyzing the Effects of Capacitances-to-Shield in Sample Probes on AC Quantized Hall Resistance Measurements
title_full Analyzing the Effects of Capacitances-to-Shield in Sample Probes on AC Quantized Hall Resistance Measurements
title_fullStr Analyzing the Effects of Capacitances-to-Shield in Sample Probes on AC Quantized Hall Resistance Measurements
title_full_unstemmed Analyzing the Effects of Capacitances-to-Shield in Sample Probes on AC Quantized Hall Resistance Measurements
title_short Analyzing the Effects of Capacitances-to-Shield in Sample Probes on AC Quantized Hall Resistance Measurements
title_sort analyzing the effects of capacitances-to-shield in sample probes on ac quantized hall resistance measurements
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4880402/
http://dx.doi.org/10.6028/jres.104.023
work_keys_str_mv AT cageme analyzingtheeffectsofcapacitancestoshieldinsampleprobesonacquantizedhallresistancemeasurements
AT jefferya analyzingtheeffectsofcapacitancestoshieldinsampleprobesonacquantizedhallresistancemeasurements