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Algorithms for Scanned Probe Microscope Image Simulation, Surface Reconstruction, and Tip Estimation
To the extent that tips are not perfectly sharp, images produced by scanned probe microscopies (SPM) such as atomic force microscopy and scanning tunneling microscopy are only approximations of the specimen surface. Tip-induced distortions are significant whenever the specimen contains features with...
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology
1997
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4882144/ https://www.ncbi.nlm.nih.gov/pubmed/27805154 http://dx.doi.org/10.6028/jres.102.030 |