High-density mapping of quantitative trait loci for grain-weight and spikelet number in rice

BACKGROUND: High grain yield is one of the most important traits requiring improvement in rice breeding programs. Consequently, the genetic basis of spikelets per panicle (SPP) and grain weight (TGW) have received much research focus because of their importance in rice yield. RESULTS: In this study,...

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Detalles Bibliográficos
Autores principales: Kim, Dong-Min, Lee, Hyun-Sook, Kwon, Soo-Jin, Fabreag, Mark Edward, Kang, Ju-Won, Yun, Yeo-Tae, Chung, Chong-Tae, Ahn, Sang-Nag
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer New York 2014
Materias:
Research
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4884038/
https://www.ncbi.nlm.nih.gov/pubmed/26055996
http://dx.doi.org/10.1186/s12284-014-0014-5

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4884038/
https://www.ncbi.nlm.nih.gov/pubmed/26055996
http://dx.doi.org/10.1186/s12284-014-0014-5

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