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Optical Diagnostics in the Gaseous Electronics Conference Reference Cell

A number of laser-induced fluorescence and absorption spectroscopy studies have been conducted using Gaseous Electronics Conference Reference Cells. Laser-induced fluorescence has been used to measure hydrogen atom densities, to measure argon metastable spatial profiles, to determine the sheath elec...

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Detalles Bibliográficos
Autores principales: Hebner, G. A., Greenberg, K. E.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 1995
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4887234/
https://www.ncbi.nlm.nih.gov/pubmed/29151748
http://dx.doi.org/10.6028/jres.100.028
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author Hebner, G. A.
Greenberg, K. E.
author_facet Hebner, G. A.
Greenberg, K. E.
author_sort Hebner, G. A.
collection PubMed
description A number of laser-induced fluorescence and absorption spectroscopy studies have been conducted using Gaseous Electronics Conference Reference Cells. Laser-induced fluorescence has been used to measure hydrogen atom densities, to measure argon metastable spatial profiles, to determine the sheath electric field, and to infer the electron density and temperature. Absorption spectroscopy, using lamp sources and diode lasers, has been used to measure metastable atom densities in helium and argon discharges and fluorocarbon densities in silicon etching discharges. The experimental techniques and sample results of these investigations are reviewed.
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spelling pubmed-48872342017-11-17 Optical Diagnostics in the Gaseous Electronics Conference Reference Cell Hebner, G. A. Greenberg, K. E. J Res Natl Inst Stand Technol Article A number of laser-induced fluorescence and absorption spectroscopy studies have been conducted using Gaseous Electronics Conference Reference Cells. Laser-induced fluorescence has been used to measure hydrogen atom densities, to measure argon metastable spatial profiles, to determine the sheath electric field, and to infer the electron density and temperature. Absorption spectroscopy, using lamp sources and diode lasers, has been used to measure metastable atom densities in helium and argon discharges and fluorocarbon densities in silicon etching discharges. The experimental techniques and sample results of these investigations are reviewed. [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 1995 /pmc/articles/PMC4887234/ /pubmed/29151748 http://dx.doi.org/10.6028/jres.100.028 Text en https://creativecommons.org/publicdomain/zero/1.0/ The Journal of Research of the National Institute of Standards and Technology is a publication of the U.S. Government. The papers are in the public domain and are not subject to copyright in the United States. Articles from J Res may contain photographs or illustrations copyrighted by other commercial organizations or individuals that may not be used without obtaining prior approval from the holder of the copyright.
spellingShingle Article
Hebner, G. A.
Greenberg, K. E.
Optical Diagnostics in the Gaseous Electronics Conference Reference Cell
title Optical Diagnostics in the Gaseous Electronics Conference Reference Cell
title_full Optical Diagnostics in the Gaseous Electronics Conference Reference Cell
title_fullStr Optical Diagnostics in the Gaseous Electronics Conference Reference Cell
title_full_unstemmed Optical Diagnostics in the Gaseous Electronics Conference Reference Cell
title_short Optical Diagnostics in the Gaseous Electronics Conference Reference Cell
title_sort optical diagnostics in the gaseous electronics conference reference cell
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4887234/
https://www.ncbi.nlm.nih.gov/pubmed/29151748
http://dx.doi.org/10.6028/jres.100.028
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