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Microwave Diagnostic Results from the Gaseous Electronics Conference RF Reference Cell

Electron density measurements with even the simplest microwave interferometry techniques can range over three to four orders of magnitude, can be responsive on time scales as fast as 50 ns, and are simple to obtain and interpret. Three groups have published electron density data taken in the Gaseous...

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Autor principal: Overzet, Lawrence J.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 1995
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4887240/
https://www.ncbi.nlm.nih.gov/pubmed/29151750
http://dx.doi.org/10.6028/jres.100.030
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author Overzet, Lawrence J.
author_facet Overzet, Lawrence J.
author_sort Overzet, Lawrence J.
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description Electron density measurements with even the simplest microwave interferometry techniques can range over three to four orders of magnitude, can be responsive on time scales as fast as 50 ns, and are simple to obtain and interpret. Three groups have published electron density data taken in the Gaseous Electronics Conference (GEC) reference reactor using microwave interferometry. The agreement in the data from these groups at higher pressures is excellent especially when one considers that the GEC reactors involved have some key differences. These may have been the cause of some differences between the results obtained at low pressures, although, the manner in which the measurements were interpreted may also have contributed. The electron densities compare favorably in argon, helium, and nitrogen above 33.3 Pa (250 mTorr); but, the measurements tend to diverge some at 13.3 Pa (100 mTorr) and in 133 Pa helium above approximately 200 mA. It is speculated that the latter difference occurs as the discharges change from a bulk ionization or α-mode to a secondary electron emission or γ-mode, and that this transition occurs at lower voltages and currents for reactors with aluminum electrodes than it does for those with stainless steel electrodes. In addition, time resolved electron densities are presented. There is agreement between time resolved measurements in the two reactors, in particular, the electron density in helium discharges is found to rise dramatically after the rf excitation is turned off while the electron densities in argon and nitrogen glows exhibit only slight increases.
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spelling pubmed-48872402017-11-17 Microwave Diagnostic Results from the Gaseous Electronics Conference RF Reference Cell Overzet, Lawrence J. J Res Natl Inst Stand Technol Article Electron density measurements with even the simplest microwave interferometry techniques can range over three to four orders of magnitude, can be responsive on time scales as fast as 50 ns, and are simple to obtain and interpret. Three groups have published electron density data taken in the Gaseous Electronics Conference (GEC) reference reactor using microwave interferometry. The agreement in the data from these groups at higher pressures is excellent especially when one considers that the GEC reactors involved have some key differences. These may have been the cause of some differences between the results obtained at low pressures, although, the manner in which the measurements were interpreted may also have contributed. The electron densities compare favorably in argon, helium, and nitrogen above 33.3 Pa (250 mTorr); but, the measurements tend to diverge some at 13.3 Pa (100 mTorr) and in 133 Pa helium above approximately 200 mA. It is speculated that the latter difference occurs as the discharges change from a bulk ionization or α-mode to a secondary electron emission or γ-mode, and that this transition occurs at lower voltages and currents for reactors with aluminum electrodes than it does for those with stainless steel electrodes. In addition, time resolved electron densities are presented. There is agreement between time resolved measurements in the two reactors, in particular, the electron density in helium discharges is found to rise dramatically after the rf excitation is turned off while the electron densities in argon and nitrogen glows exhibit only slight increases. [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 1995 /pmc/articles/PMC4887240/ /pubmed/29151750 http://dx.doi.org/10.6028/jres.100.030 Text en https://creativecommons.org/publicdomain/zero/1.0/ The Journal of Research of the National Institute of Standards and Technology is a publication of the U.S. Government. The papers are in the public domain and are not subject to copyright in the United States. Articles from J Res may contain photographs or illustrations copyrighted by other commercial organizations or individuals that may not be used without obtaining prior approval from the holder of the copyright.
spellingShingle Article
Overzet, Lawrence J.
Microwave Diagnostic Results from the Gaseous Electronics Conference RF Reference Cell
title Microwave Diagnostic Results from the Gaseous Electronics Conference RF Reference Cell
title_full Microwave Diagnostic Results from the Gaseous Electronics Conference RF Reference Cell
title_fullStr Microwave Diagnostic Results from the Gaseous Electronics Conference RF Reference Cell
title_full_unstemmed Microwave Diagnostic Results from the Gaseous Electronics Conference RF Reference Cell
title_short Microwave Diagnostic Results from the Gaseous Electronics Conference RF Reference Cell
title_sort microwave diagnostic results from the gaseous electronics conference rf reference cell
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4887240/
https://www.ncbi.nlm.nih.gov/pubmed/29151750
http://dx.doi.org/10.6028/jres.100.030
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