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Current and Voltage Measurements in the Gaseous Electronics Conference RF Reference Cell
Measurements of the electrical characteristics of discharges in the Gaseous Electronics Conference Radio-Frequency Reference Cell are reviewed here. Topics include: common sources of error in the measurements; comparisons of current and voltage data among GEC cells; the effects of gas impurities, su...
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology
1995
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Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4887242/ https://www.ncbi.nlm.nih.gov/pubmed/29151746 http://dx.doi.org/10.6028/jres.100.026 |
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author | Sobolewski, Mark A. |
author_facet | Sobolewski, Mark A. |
author_sort | Sobolewski, Mark A. |
collection | PubMed |
description | Measurements of the electrical characteristics of discharges in the Gaseous Electronics Conference Radio-Frequency Reference Cell are reviewed here. Topics include: common sources of error in the measurements; comparisons of current and voltage data among GEC cells; the effects of gas impurities, surface conditions and the external circuitry on the reproducibility of the electrical characteristics; and comparisons of current and voltage data with results of other measurements. |
format | Online Article Text |
id | pubmed-4887242 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 1995 |
publisher | [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology |
record_format | MEDLINE/PubMed |
spelling | pubmed-48872422017-11-17 Current and Voltage Measurements in the Gaseous Electronics Conference RF Reference Cell Sobolewski, Mark A. J Res Natl Inst Stand Technol Article Measurements of the electrical characteristics of discharges in the Gaseous Electronics Conference Radio-Frequency Reference Cell are reviewed here. Topics include: common sources of error in the measurements; comparisons of current and voltage data among GEC cells; the effects of gas impurities, surface conditions and the external circuitry on the reproducibility of the electrical characteristics; and comparisons of current and voltage data with results of other measurements. [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 1995 /pmc/articles/PMC4887242/ /pubmed/29151746 http://dx.doi.org/10.6028/jres.100.026 Text en https://creativecommons.org/publicdomain/zero/1.0/ The Journal of Research of the National Institute of Standards and Technology is a publication of the U.S. Government. The papers are in the public domain and are not subject to copyright in the United States. Articles from J Res may contain photographs or illustrations copyrighted by other commercial organizations or individuals that may not be used without obtaining prior approval from the holder of the copyright. |
spellingShingle | Article Sobolewski, Mark A. Current and Voltage Measurements in the Gaseous Electronics Conference RF Reference Cell |
title | Current and Voltage Measurements in the Gaseous Electronics Conference RF Reference Cell |
title_full | Current and Voltage Measurements in the Gaseous Electronics Conference RF Reference Cell |
title_fullStr | Current and Voltage Measurements in the Gaseous Electronics Conference RF Reference Cell |
title_full_unstemmed | Current and Voltage Measurements in the Gaseous Electronics Conference RF Reference Cell |
title_short | Current and Voltage Measurements in the Gaseous Electronics Conference RF Reference Cell |
title_sort | current and voltage measurements in the gaseous electronics conference rf reference cell |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4887242/ https://www.ncbi.nlm.nih.gov/pubmed/29151746 http://dx.doi.org/10.6028/jres.100.026 |
work_keys_str_mv | AT sobolewskimarka currentandvoltagemeasurementsinthegaseouselectronicsconferencerfreferencecell |