Calculating the Effects of Longitudinal Resistance in Multi-Series-Connected Quantum Hall Effect Devices

Many ac quantized Hall resistance experiments have measured significant values of ac longitudinal resistances under temperature and magnetic field conditions in which the dc longitudinal resistance values were negligible. We investigate the effect of non-vanishing ac longitudinal resistances on meas...

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Detalles Bibliográficos
Autores principales: Cage, M. E., Jeffery, A., Elmquist, R. E., Lee, K. C.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 1998
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4890950/
https://www.ncbi.nlm.nih.gov/pubmed/28009360
http://dx.doi.org/10.6028/jres.103.037

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