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Aperture Proximity Effects in High Heat Flux Sensors Calibration

In the transfer calibration of heat flux sensors, a correction for the irradiance distribution across the sensing area may be required when the sensing areas of the reference and test sensors are different. A method to calculate this correction using well-known equations for the configuration factor...

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Detalles Bibliográficos
Autores principales: Murthy, A. V., Tsai, B. K., Saunders, R. D.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 1998
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4890953/
https://www.ncbi.nlm.nih.gov/pubmed/28009369
http://dx.doi.org/10.6028/jres.103.041
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author Murthy, A. V.
Tsai, B. K.
Saunders, R. D.
author_facet Murthy, A. V.
Tsai, B. K.
Saunders, R. D.
author_sort Murthy, A. V.
collection PubMed
description In the transfer calibration of heat flux sensors, a correction for the irradiance distribution across the sensing area may be required when the sensing areas of the reference and test sensors are different. A method to calculate this correction using well-known equations for the configuration factors is presented. Also, estimates of the correction for test conditions corresponding to the transfer calibration technique in use at the National Institute of Standards and Technology are given.
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spelling pubmed-48909532016-12-22 Aperture Proximity Effects in High Heat Flux Sensors Calibration Murthy, A. V. Tsai, B. K. Saunders, R. D. J Res Natl Inst Stand Technol Article In the transfer calibration of heat flux sensors, a correction for the irradiance distribution across the sensing area may be required when the sensing areas of the reference and test sensors are different. A method to calculate this correction using well-known equations for the configuration factors is presented. Also, estimates of the correction for test conditions corresponding to the transfer calibration technique in use at the National Institute of Standards and Technology are given. [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 1998 1998-12-01 /pmc/articles/PMC4890953/ /pubmed/28009369 http://dx.doi.org/10.6028/jres.103.041 Text en https://creativecommons.org/publicdomain/zero/1.0/ The Journal of Research of the National Institute of Standards and Technology is a publication of the U.S. Government. The papers are in the public domain and are not subject to copyright in the United States. Articles from J Res may contain photographs or illustrations copyrighted by other commercial organizations or individuals that may not be used without obtaining prior approval from the holder of the copyright.
spellingShingle Article
Murthy, A. V.
Tsai, B. K.
Saunders, R. D.
Aperture Proximity Effects in High Heat Flux Sensors Calibration
title Aperture Proximity Effects in High Heat Flux Sensors Calibration
title_full Aperture Proximity Effects in High Heat Flux Sensors Calibration
title_fullStr Aperture Proximity Effects in High Heat Flux Sensors Calibration
title_full_unstemmed Aperture Proximity Effects in High Heat Flux Sensors Calibration
title_short Aperture Proximity Effects in High Heat Flux Sensors Calibration
title_sort aperture proximity effects in high heat flux sensors calibration
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4890953/
https://www.ncbi.nlm.nih.gov/pubmed/28009369
http://dx.doi.org/10.6028/jres.103.041
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