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Droplet etching of deep nanoholes for filling with self-aligned complex quantum structures

Strain-free epitaxial quantum dots (QDs) are fabricated by a combination of Al local droplet etching (LDE) of nanoholes in AlGaAs surfaces and subsequent hole filling with GaAs. The whole process is performed in a conventional molecular beam epitaxy (MBE) chamber. Autocorrelation measurements establ...

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Autores principales: Küster, Achim, Heyn, Christian, Ungeheuer, Arne, Juska, Gediminas, Tommaso Moroni, Stefano, Pelucchi, Emanuele, Hansen, Wolfgang
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer US 2016
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4891312/
https://www.ncbi.nlm.nih.gov/pubmed/27255902
http://dx.doi.org/10.1186/s11671-016-1495-5
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author Küster, Achim
Heyn, Christian
Ungeheuer, Arne
Juska, Gediminas
Tommaso Moroni, Stefano
Pelucchi, Emanuele
Hansen, Wolfgang
author_facet Küster, Achim
Heyn, Christian
Ungeheuer, Arne
Juska, Gediminas
Tommaso Moroni, Stefano
Pelucchi, Emanuele
Hansen, Wolfgang
author_sort Küster, Achim
collection PubMed
description Strain-free epitaxial quantum dots (QDs) are fabricated by a combination of Al local droplet etching (LDE) of nanoholes in AlGaAs surfaces and subsequent hole filling with GaAs. The whole process is performed in a conventional molecular beam epitaxy (MBE) chamber. Autocorrelation measurements establish single-photon emission from LDE QDs with a very small correlation function g ((2))(0)≃ 0.01 of the exciton emission. Here, we focus on the influence of the initial hole depth on the QD optical properties with the goal to create deep holes suited for filling with more complex nanostructures like quantum dot molecules (QDM). The depth of droplet etched nanoholes is controlled by the droplet material coverage and the process temperature, where a higher coverage or temperature yields deeper holes. The requirements of high quantum dot uniformity and narrow luminescence linewidth, which are often found in applications, set limits to the process temperature. At high temperatures, the hole depths become inhomogeneous and the linewidth rapidly increases beyond 640 °C. With the present process technique, we identify an upper limit of 40-nm hole depth if the linewidth has to remain below 100 μeV. Furthermore, we study the exciton fine-structure splitting which is increased from 4.6 μeV in 15-nm-deep to 7.9 μeV in 35-nm-deep holes. As an example for the functionalization of deep nanoholes, self-aligned vertically stacked GaAs QD pairs are fabricated by filling of holes with 35 nm depth. Exciton peaks from stacked dots show linewidths below 100 μeV which is close to that from single QDs.
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spelling pubmed-48913122016-06-17 Droplet etching of deep nanoholes for filling with self-aligned complex quantum structures Küster, Achim Heyn, Christian Ungeheuer, Arne Juska, Gediminas Tommaso Moroni, Stefano Pelucchi, Emanuele Hansen, Wolfgang Nanoscale Res Lett Nano Express Strain-free epitaxial quantum dots (QDs) are fabricated by a combination of Al local droplet etching (LDE) of nanoholes in AlGaAs surfaces and subsequent hole filling with GaAs. The whole process is performed in a conventional molecular beam epitaxy (MBE) chamber. Autocorrelation measurements establish single-photon emission from LDE QDs with a very small correlation function g ((2))(0)≃ 0.01 of the exciton emission. Here, we focus on the influence of the initial hole depth on the QD optical properties with the goal to create deep holes suited for filling with more complex nanostructures like quantum dot molecules (QDM). The depth of droplet etched nanoholes is controlled by the droplet material coverage and the process temperature, where a higher coverage or temperature yields deeper holes. The requirements of high quantum dot uniformity and narrow luminescence linewidth, which are often found in applications, set limits to the process temperature. At high temperatures, the hole depths become inhomogeneous and the linewidth rapidly increases beyond 640 °C. With the present process technique, we identify an upper limit of 40-nm hole depth if the linewidth has to remain below 100 μeV. Furthermore, we study the exciton fine-structure splitting which is increased from 4.6 μeV in 15-nm-deep to 7.9 μeV in 35-nm-deep holes. As an example for the functionalization of deep nanoholes, self-aligned vertically stacked GaAs QD pairs are fabricated by filling of holes with 35 nm depth. Exciton peaks from stacked dots show linewidths below 100 μeV which is close to that from single QDs. Springer US 2016-06-03 /pmc/articles/PMC4891312/ /pubmed/27255902 http://dx.doi.org/10.1186/s11671-016-1495-5 Text en © Küster et al. 2016 Open Access This article is distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution, and reproduction in any medium, provided you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made.
spellingShingle Nano Express
Küster, Achim
Heyn, Christian
Ungeheuer, Arne
Juska, Gediminas
Tommaso Moroni, Stefano
Pelucchi, Emanuele
Hansen, Wolfgang
Droplet etching of deep nanoholes for filling with self-aligned complex quantum structures
title Droplet etching of deep nanoholes for filling with self-aligned complex quantum structures
title_full Droplet etching of deep nanoholes for filling with self-aligned complex quantum structures
title_fullStr Droplet etching of deep nanoholes for filling with self-aligned complex quantum structures
title_full_unstemmed Droplet etching of deep nanoholes for filling with self-aligned complex quantum structures
title_short Droplet etching of deep nanoholes for filling with self-aligned complex quantum structures
title_sort droplet etching of deep nanoholes for filling with self-aligned complex quantum structures
topic Nano Express
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4891312/
https://www.ncbi.nlm.nih.gov/pubmed/27255902
http://dx.doi.org/10.1186/s11671-016-1495-5
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