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Current Distributions in Quantum Hall Effect Devices
This paper addresses the question of how current is distributed within quantum Hall effect devices. Three types of flow patterns most often mentioned in the literature are considered. They are: (1) skipping orbits along the device periphery (which arise from elastic collisions off hard-walled potent...
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Formato: | Online Artículo Texto |
Lenguaje: | English |
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[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology
1997
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Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4894586/ https://www.ncbi.nlm.nih.gov/pubmed/27805115 http://dx.doi.org/10.6028/jres.102.045 |
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author | Cage, M. E. |
author_facet | Cage, M. E. |
author_sort | Cage, M. E. |
collection | PubMed |
description | This paper addresses the question of how current is distributed within quantum Hall effect devices. Three types of flow patterns most often mentioned in the literature are considered. They are: (1) skipping orbits along the device periphery (which arise from elastic collisions off hard-walled potentials); (2) narrow conducting channels along the device sides (which are presumed to be generated from confining potentials); and (3) currents distributed throughout the device (which are assumed to arise from a combination of confining and charge-redistribution potentials). The major conclusions are that skipping orbits do not occur in quantum Hall effect devices, and that nearly all of the externally applied current is located within the device interior rather than along the device edges. |
format | Online Article Text |
id | pubmed-4894586 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 1997 |
publisher | [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology |
record_format | MEDLINE/PubMed |
spelling | pubmed-48945862016-10-28 Current Distributions in Quantum Hall Effect Devices Cage, M. E. J Res Natl Inst Stand Technol Article This paper addresses the question of how current is distributed within quantum Hall effect devices. Three types of flow patterns most often mentioned in the literature are considered. They are: (1) skipping orbits along the device periphery (which arise from elastic collisions off hard-walled potentials); (2) narrow conducting channels along the device sides (which are presumed to be generated from confining potentials); and (3) currents distributed throughout the device (which are assumed to arise from a combination of confining and charge-redistribution potentials). The major conclusions are that skipping orbits do not occur in quantum Hall effect devices, and that nearly all of the externally applied current is located within the device interior rather than along the device edges. [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 1997 /pmc/articles/PMC4894586/ /pubmed/27805115 http://dx.doi.org/10.6028/jres.102.045 Text en https://creativecommons.org/publicdomain/zero/1.0/ The Journal of Research of the National Institute of Standards and Technology is a publication of the U.S. Government. The papers are in the public domain and are not subject to copyright in the United States. Articles from J Res may contain photographs or illustrations copyrighted by other commercial organizations or individuals that may not be used without obtaining prior approval from the holder of the copyright. |
spellingShingle | Article Cage, M. E. Current Distributions in Quantum Hall Effect Devices |
title | Current Distributions in Quantum Hall Effect Devices |
title_full | Current Distributions in Quantum Hall Effect Devices |
title_fullStr | Current Distributions in Quantum Hall Effect Devices |
title_full_unstemmed | Current Distributions in Quantum Hall Effect Devices |
title_short | Current Distributions in Quantum Hall Effect Devices |
title_sort | current distributions in quantum hall effect devices |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4894586/ https://www.ncbi.nlm.nih.gov/pubmed/27805115 http://dx.doi.org/10.6028/jres.102.045 |
work_keys_str_mv | AT cageme currentdistributionsinquantumhalleffectdevices |