Using NIST Crystal Data Within Siemens Software for Four-Circle and SMART CCD Diffractometers

NIST Crystal Data developed at The National Institute for Standards and Technology has been incorporated with Siemens single crystal software for data collection on four-circle and two-dimensional CCD diffractometers. Why this database is useful in the process of single crystal structure determinati...

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Detalles Bibliográficos
Autores principales: Byram, Susan K., Campana, Charles F., Fait, James, Sparks, Robert A.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 1996
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4894605/
https://www.ncbi.nlm.nih.gov/pubmed/27805166
http://dx.doi.org/10.6028/jres.101.030

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