Phase Identification in a Scanning Electron Microscope Using Backscattered Electron Kikuchi Patterns

Backscattered electron Kikuchi patterns (BEKP) suitable for crystallographic phase analysis can be collected in the scanning electron microscope (SEM) with a newly developed charge coupled device (CCD) based detector. Crystallographic phase identification using BEKP in the SEM is unique in that it p...

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Detalles Bibliográficos
Autores principales: Goehner, R. P., Michael, J. R.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 1996
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4894610/
https://www.ncbi.nlm.nih.gov/pubmed/27805167
http://dx.doi.org/10.6028/jres.101.031
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author Goehner, R. P.
Michael, J. R.
author_facet Goehner, R. P.
Michael, J. R.
author_sort Goehner, R. P.
collection PubMed
description Backscattered electron Kikuchi patterns (BEKP) suitable for crystallographic phase analysis can be collected in the scanning electron microscope (SEM) with a newly developed charge coupled device (CCD) based detector. Crystallographic phase identification using BEKP in the SEM is unique in that it permits high magnification images and BEKPs to be collected from a bulk specimen. The combination of scanning electron microscope (SEM) imaging, BEKP, and energy dispersive x-ray spectrometry holds the promise of a powerful new tool for materials science.
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spelling pubmed-48946102016-10-28 Phase Identification in a Scanning Electron Microscope Using Backscattered Electron Kikuchi Patterns Goehner, R. P. Michael, J. R. J Res Natl Inst Stand Technol Article Backscattered electron Kikuchi patterns (BEKP) suitable for crystallographic phase analysis can be collected in the scanning electron microscope (SEM) with a newly developed charge coupled device (CCD) based detector. Crystallographic phase identification using BEKP in the SEM is unique in that it permits high magnification images and BEKPs to be collected from a bulk specimen. The combination of scanning electron microscope (SEM) imaging, BEKP, and energy dispersive x-ray spectrometry holds the promise of a powerful new tool for materials science. [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 1996 /pmc/articles/PMC4894610/ /pubmed/27805167 http://dx.doi.org/10.6028/jres.101.031 Text en https://creativecommons.org/publicdomain/zero/1.0/ The Journal of Research of the National Institute of Standards and Technology is a publication of the U.S. Government. The papers are in the public domain and are not subject to copyright in the United States. Articles from J Res may contain photographs or illustrations copyrighted by other commercial organizations or individuals that may not be used without obtaining prior approval from the holder of the copyright.
spellingShingle Article
Goehner, R. P.
Michael, J. R.
Phase Identification in a Scanning Electron Microscope Using Backscattered Electron Kikuchi Patterns
title Phase Identification in a Scanning Electron Microscope Using Backscattered Electron Kikuchi Patterns
title_full Phase Identification in a Scanning Electron Microscope Using Backscattered Electron Kikuchi Patterns
title_fullStr Phase Identification in a Scanning Electron Microscope Using Backscattered Electron Kikuchi Patterns
title_full_unstemmed Phase Identification in a Scanning Electron Microscope Using Backscattered Electron Kikuchi Patterns
title_short Phase Identification in a Scanning Electron Microscope Using Backscattered Electron Kikuchi Patterns
title_sort phase identification in a scanning electron microscope using backscattered electron kikuchi patterns
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4894610/
https://www.ncbi.nlm.nih.gov/pubmed/27805167
http://dx.doi.org/10.6028/jres.101.031
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