Effects of Curved Wavefronts on Conductor-Backed Reflection-Only Free-Space Material Characterization Techniques

A true plane wave is often not physically realizable in a laboratory environment. Therefore, wavefront curvature introduces a form of systematic error into Free-space material characterization methods. Free-space material characterization is important to the determination of the electric permittivit...

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Detalles Bibliográficos
Autores principales: Fenner, Raenita A., Rothwell, Edward J.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Hindawi Publishing Corporation 2015
Materias:
Research Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4897409/
https://www.ncbi.nlm.nih.gov/pubmed/27347536
http://dx.doi.org/10.1155/2015/657254

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4897409/
https://www.ncbi.nlm.nih.gov/pubmed/27347536
http://dx.doi.org/10.1155/2015/657254

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