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Effects of Curved Wavefronts on Conductor-Backed Reflection-Only Free-Space Material Characterization Techniques
A true plane wave is often not physically realizable in a laboratory environment. Therefore, wavefront curvature introduces a form of systematic error into Free-space material characterization methods. Free-space material characterization is important to the determination of the electric permittivit...
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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Hindawi Publishing Corporation
2015
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4897409/ https://www.ncbi.nlm.nih.gov/pubmed/27347536 http://dx.doi.org/10.1155/2015/657254 |